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Takeshi Todoroki
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Gunma, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Exchangeable contact unit and inspection jig
Patent number
10,393,771
Issue date
Aug 27, 2019
Yokowo Co., Ltd.
Takahiro Nagata
G01 - MEASURING TESTING
Information
Patent Grant
Contact unit and inspection jig
Patent number
10,024,883
Issue date
Jul 17, 2018
Yokowo Co., Ltd.
Takahiro Nagata
G01 - MEASURING TESTING
Information
Patent Grant
Contact probe and socket
Patent number
8,723,540
Issue date
May 13, 2014
Yokowo Co., Ltd.
Tsugio Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Inspection unit
Patent number
8,159,249
Issue date
Apr 17, 2012
Yokowo Co., Ltd.
Takeshi Todoroki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PROBE CARD
Publication number
20240329085
Publication date
Oct 3, 2024
YOKOWO CO., LTD.
Takeshi TODOROKI
G01 - MEASURING TESTING
Information
Patent Application
CONTACT UNIT AND INSPECTION JIG
Publication number
20160282386
Publication date
Sep 29, 2016
YOKOWO CO., LTD
Takahiro Nagata
G01 - MEASURING TESTING
Information
Patent Application
EXCHANGEABLE CONTACT UNIT AND INSPECTION JIG
Publication number
20160187378
Publication date
Jun 30, 2016
YOKOWO CO., LTD.
Takahiro NAGATA
G01 - MEASURING TESTING
Information
Patent Application
CONTACT PROBE AND SOCKET
Publication number
20120182036
Publication date
Jul 19, 2012
Tsugio Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION UNIT
Publication number
20100066394
Publication date
Mar 18, 2010
YOKOWO CO., LTD
Takeshi Todoroki
G01 - MEASURING TESTING