Takeshi Tomita

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Magnetic domain imaging system
- Patent number 8,158,940
- Issue date Apr 17, 2012
- Jeol Ltd.
- Takeshi Tomita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope equipped with electron biprism
- Patent number 6,759,656
- Issue date Jul 6, 2004
- Jeol Ltd.
- Takeshi Tomita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-beam biprism
- Patent number 5,811,806
- Issue date Sep 22, 1998
- Jeol Ltd.
- Toshikazu Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam-generating apparatus
- Patent number 5,763,889
- Issue date Jun 9, 1998
- Jeol Ltd.
- Takeshi Tomita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for producing and accelerating an electron beam
- Patent number 4,814,716
- Issue date Mar 21, 1989
- Jeol Ltd.
- Shoji Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission-type electron microscope
- Patent number 4,633,085
- Issue date Dec 30, 1986
- Jeol Ltd.
- Takeshi Tomita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam focusing system for electron microscope
- Patent number 4,626,689
- Issue date Dec 2, 1986
- Jeol Ltd.
- Takeshi Tomita
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Magnetic Domain Imaging System
- Publication number 20100294932
- Publication date Nov 25, 2010
- JEOL Ltd.
- Takeshi Tomita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope equipped with electron biprism
- Publication number 20020084412
- Publication date Jul 4, 2002
- JEOL Ltd.
- Takeshi Tomita
- H01 - BASIC ELECTRIC ELEMENTS