Takeshi Watabe

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Chiba, JP

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Patents Grantslast 30 patents

Information Patent Grant
High-speed rotation testing apparatus
- Patent number 6,615,670
- Issue date Sep 9, 2003
- Maruwa Electronic Inc.
- Koji Shibasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High-speed rotation testing apparatus
- Publication number 20020112546
- Publication date Aug 22, 2002
- Maruwa Electronic Inc.
- Koji Shibasaki
- G01 - MEASURING TESTING