Takeshi Yamamoto

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe measuring force adjuster
- Patent number 10,113,931
- Issue date Oct 30, 2018
- Mitutoyo Corporation
- Hideyuki Arai
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe
- Patent number 9,869,537
- Issue date Jan 16, 2018
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Form measuring machine
- Patent number 9,518,811
- Issue date Dec 13, 2016
- Mitutoyo Corporation
- Takeshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Lever type measuring machine
- Patent number 9,303,968
- Issue date Apr 5, 2016
- Mitutoyo Corporation
- Yasunori Mori
- G01 - MEASURING TESTING
Information Patent Grant
Lever-type detector, stylus, and automatic stylus exchanger
- Patent number 8,869,601
- Issue date Oct 28, 2014
- Mitutoyo Corporation
- Takeshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Linear guiding mechanism and measuring device
- Patent number 8,261,461
- Issue date Sep 11, 2012
- Mitutoyo Corporation
- Atsushi Shimaoka
- G12 - INSTRUMENT DETAILS
Information Patent Grant
Measuring force control apparatus
- Patent number 8,161,657
- Issue date Apr 24, 2012
- Mitutoyo Corporation
- Takeshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument
- Patent number 7,895,764
- Issue date Mar 1, 2011
- Mitutoyo Corporation
- Kazuhiro Ishizu
- G01 - MEASURING TESTING
Information Patent Grant
Alignment adjusting mechanism and measuring instrument
- Patent number 7,882,644
- Issue date Feb 8, 2011
- Mitutoyo Corporation
- Takeshi Kawabata
- G01 - MEASURING TESTING
Information Patent Grant
Measurement control device and measurement control method
- Patent number 7,784,333
- Issue date Aug 31, 2010
- Mitutoyo Corporation
- Kentaro Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Probe and contour measuring instrument
- Patent number 7,352,271
- Issue date Apr 1, 2008
- Mitutoyo Corporation
- Kentaro Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe
- Patent number 7,076,883
- Issue date Jul 18, 2006
- Mitutoyo Corporation
- Takeshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Surface-tracking measuring machine
- Patent number 6,295,866
- Issue date Oct 2, 2001
- Mitutoyo Corporation
- Takeshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inner diameter measuring machine
- Patent number 4,885,845
- Issue date Dec 12, 1989
- Mitutoyo Corporation
- Takeshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Two-directional touch sensor
- Patent number 4,561,190
- Issue date Dec 31, 1985
- Mitutoyo Mfg. Co., Ltd.
- Takeshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Digital indication type measuring machine
- Patent number 4,536,963
- Issue date Aug 27, 1985
- Mitutoyo Mfg. Co., Ltd.
- Takeshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Cylinder gauge
- Patent number 4,476,634
- Issue date Oct 16, 1984
- Mitutoyo Mfg. Co., Ltd.
- Takeshi Yamamoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE MEASURING FORCE ADJUSTER
- Publication number 20160299028
- Publication date Oct 13, 2016
- MITUTOYO CORPORATION
- Hideyuki ARAI
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE
- Publication number 20160258732
- Publication date Sep 8, 2016
- MITUTOYO CORPORATION
- Kazuhiko HIDAKA
- G01 - MEASURING TESTING
Information Patent Application
FORM MEASURING MACHINE
- Publication number 20150292851
- Publication date Oct 15, 2015
- MITUTOYO CORPORATION
- Takeshi YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
LEVER TYPE MEASURING MACHINE
- Publication number 20150075020
- Publication date Mar 19, 2015
- MITUTOYO CORPORATION
- Yasunori MORI
- G01 - MEASURING TESTING
Information Patent Application
LEVER-TYPE DETECTOR, STYLUS, AND AUTOMATIC STYLUS EXCHANGER
- Publication number 20110162444
- Publication date Jul 7, 2011
- Mitutoyo Corporation
- Takeshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
MEASURING FORCE CONTROL APPARATUS
- Publication number 20110088273
- Publication date Apr 21, 2011
- Mitutoyo Corporation
- Takeshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT ADJUSTING MECHANISM AND MEASURING INSTRUMENT
- Publication number 20100299946
- Publication date Dec 2, 2010
- Mitutoyo Corporation
- Takeshi Kawabata
- G01 - MEASURING TESTING
Information Patent Application
LINEAR GUIDING MECHANISM AND MEASURING DEVICE
- Publication number 20100180458
- Publication date Jul 22, 2010
- Mitutoyo Corporation
- Atsushi Shimaoka
- G12 - INSTRUMENT DETAILS
Information Patent Application
Measuring instrument
- Publication number 20090229138
- Publication date Sep 17, 2009
- Mitutoyo Corporation
- Kazuhiro Ishizu
- G01 - MEASURING TESTING
Information Patent Application
Measurement control device, contour measuring instrument and measur...
- Publication number 20070266781
- Publication date Nov 22, 2007
- Mitutoyo Corporation
- Kentaro Nemoto
- G01 - MEASURING TESTING
Information Patent Application
Probe and contour measuring instrument
- Publication number 20070266582
- Publication date Nov 22, 2007
- Mitutoyo Corporation
- Kentaro Nemoto
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe
- Publication number 20050022409
- Publication date Feb 3, 2005
- Mitutoyo Corporation
- Takeshi Yamamoto
- G01 - MEASURING TESTING

Takeshi Yamamoto

Person

Patents Grantslast 30 patents

Probe measuring force adjuster

Contact probe

Form measuring machine

Lever type measuring machine

Lever-type detector, stylus, and automatic stylus exchanger

Linear guiding mechanism and measuring device

Measuring force control apparatus

Measuring instrument

Alignment adjusting mechanism and measuring instrument

Measurement control device and measurement control method

Probe and contour measuring instrument

Scanning probe

Surface-tracking measuring machine

Inner diameter measuring machine

Two-directional touch sensor

Digital indication type measuring machine

Cylinder gauge

Patents Applicationslast 30 patents

PROBE MEASURING FORCE ADJUSTER

CONTACT PROBE

FORM MEASURING MACHINE

LEVER TYPE MEASURING MACHINE

LEVER-TYPE DETECTOR, STYLUS, AND AUTOMATIC STYLUS EXCHANGER

MEASURING FORCE CONTROL APPARATUS

ALIGNMENT ADJUSTING MECHANISM AND MEASURING INSTRUMENT

LINEAR GUIDING MECHANISM AND MEASURING DEVICE

Measuring instrument

Measurement control device, contour measuring instrument and measur...

Probe and contour measuring instrument

Scanning probe