Takeshi YAMANE

Person

Tsukuba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image pickup device and image generation method
- Patent number 12,181,425
- Issue date Dec 31, 2024
- Kioxia Corporation
- Takeshi Yamane
- G01 - MEASURING TESTING
Information Patent Grant
Particle detector, particle detection apparatus, and particle detec...
- Patent number 11,588,092
- Issue date Feb 21, 2023
- Kioxia Corporation
- Takeshi Yamane
- G01 - MEASURING TESTING
Information Patent Grant
Imaging device, image generating device, and imaging method
- Patent number 11,573,392
- Issue date Feb 7, 2023
- Kioxia Corporation
- Takeshi Yamane
- G02 - OPTICS
Information Patent Grant
Particle detection device and image generation apparatus
- Patent number 11,513,238
- Issue date Nov 29, 2022
- Kioxia Corporation
- Takeshi Yamane
- G01 - MEASURING TESTING
Information Patent Grant
Particle detector, image generation device, and image generation me...
- Patent number 11,402,520
- Issue date Aug 2, 2022
- Kioxia Corporation
- Takeshi Yamane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Superconducting element, particle detection device, and particle de...
- Patent number 11,211,541
- Issue date Dec 28, 2021
- TOSHIBA MEMORY CORPORATION
- Takeshi Yamane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image acquisition apparatus and image acquisition method
- Patent number 11,054,625
- Issue date Jul 6, 2021
- TOSHIBA MEMORY CORPORATION
- Takeshi Yamane
- G02 - OPTICS
Information Patent Grant
Superconducting element, particle detection device, and particle de...
- Patent number 10,962,657
- Issue date Mar 30, 2021
- TOSHIBA MEMORY CORPORATION
- Takeshi Yamane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging apparatus and imaging method
- Patent number 9,958,399
- Issue date May 1, 2018
- Kabushiki Kaisha Toshiba
- Takeshi Yamane
- G02 - OPTICS
Information Patent Grant
Method and apparatus for inspecting a mask substrate for defects, m...
- Patent number 8,986,913
- Issue date Mar 24, 2015
- Kabushiki Kaisha Toshiba
- Takeshi Yamane
- G01 - MEASURING TESTING
Information Patent Grant
Optimum imaging position detecting method, optimum imaging position...
- Patent number 8,912,501
- Issue date Dec 16, 2014
- Kabushiki Kaisha Toshiba
- Takeshi Yamane
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Mask inspection method and mask inspection apparatus
- Patent number 8,797,524
- Issue date Aug 5, 2014
- Kabushiki Kaisha Toshiba
- Takeshi Yamane
- G01 - MEASURING TESTING
Information Patent Grant
Mask defect inspection method and defect inspection apparatus
- Patent number 8,699,783
- Issue date Apr 15, 2014
- Kabushiki Kaisha Toshiba
- Takeshi Yamane
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of semiconductor device and manufacturing meth...
- Patent number 8,435,702
- Issue date May 7, 2013
- Renesas Electronics Corporation
- Tsuneo Terasawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Mask defect measurement method, mask quality determination and meth...
- Patent number 8,384,888
- Issue date Feb 26, 2013
- Kabushiki Kaisha Toshiba
- Takeshi Yamane
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring dimension of photo-mask pattern
- Patent number 7,756,661
- Issue date Jul 13, 2010
- Kabushiki Kaisha Toshiba
- Takeshi Yamane
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
IMAGING DEVICE AND IMAGE GENERATION METHOD
- Publication number 20240096515
- Publication date Mar 21, 2024
- KIOXIA Corporation
- Takeshi YAMANE
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
IMAGE PICKUP DEVICE AND IMAGE GENERATION METHOD
- Publication number 20230144201
- Publication date May 11, 2023
- KIOXIA Corporation
- Takeshi YAMANE
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE DETECTION DEVICE AND IMAGE GENERATION APPARATUS
- Publication number 20220317317
- Publication date Oct 6, 2022
- KIOXIA Corporation
- Takeshi YAMANE
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE DETECTOR, PARTICLE DETECTION APPARATUS, AND PARTICLE DETEC...
- Publication number 20220069191
- Publication date Mar 3, 2022
- KIOXIA Corporation
- Takeshi YAMANE
- G01 - MEASURING TESTING
Information Patent Application
IMAGING DEVICE, IMAGE GENERATING DEVICE, AND IMAGING METHOD
- Publication number 20210231905
- Publication date Jul 29, 2021
- KIOXIA Corporation
- Takeshi YAMANE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE ACQUISITION APPARATUS AND IMAGE ACQUISITION METHOD
- Publication number 20200285034
- Publication date Sep 10, 2020
- Toshiba Memory Corporation
- Takeshi YAMANE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PARTICLE DETECTOR, IMAGE GENERATION DEVICE, AND IMAGE GENERATION ME...
- Publication number 20200033488
- Publication date Jan 30, 2020
- Toshiba Memory Corporation
- Takeshi YAMANE
- G01 - MEASURING TESTING
Information Patent Application
SUPERCONDUCTING ELEMENT, PARTICLE DETECTION DEVICE, AND PARTICLE DE...
- Publication number 20200011999
- Publication date Jan 9, 2020
- Toshiba Memory Corporation
- Takeshi YAMANE
- G01 - MEASURING TESTING
Information Patent Application
SUPERCONDUCTING ELEMENT, PARTICLE DETECTION DEVICE, AND PARTICLE DE...
- Publication number 20200013943
- Publication date Jan 9, 2020
- Toshiba Memory Corporation
- Takeshi YAMANE
- G01 - MEASURING TESTING
Information Patent Application
IMAGING APPARATUS AND IMAGING METHOD
- Publication number 20160274033
- Publication date Sep 22, 2016
- Kabushiki Kaisha Toshiba
- Takeshi YAMANE
- G01 - MEASURING TESTING
Information Patent Application
IMAGING APPARATUS AND IMAGING METHOD
- Publication number 20150138344
- Publication date May 21, 2015
- Kabushiki Kaisha Toshiba
- Takeshi Yamane
- G02 - OPTICS
Information Patent Application
Method and Apparatus for Inspecting a Mask Substrate for Defects, M...
- Publication number 20130244142
- Publication date Sep 19, 2013
- Takeshi YAMANE
- G01 - MEASURING TESTING
Information Patent Application
Optimum Imaging Position Detecting Method, Optimum Imaging Position...
- Publication number 20130244143
- Publication date Sep 19, 2013
- Kabushiki Kaihsa Toshiba
- Takeshi YAMANE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MASK INSPECTION METHOD AND MASK INSPECTION APPARATUS
- Publication number 20120224051
- Publication date Sep 6, 2012
- Takeshi YAMANE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MASK INSPECTION METHOD AND MASK INSPECTION APPARATUS
- Publication number 20120218543
- Publication date Aug 30, 2012
- Takeshi YAMANE
- G01 - MEASURING TESTING
Information Patent Application
MASK DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS
- Publication number 20120063667
- Publication date Mar 15, 2012
- Takeshi YAMANE
- G01 - MEASURING TESTING
Information Patent Application
MASK DEFECT MEASUREMENT METHOD, MASK QUALITY DETERMINATION METHOD,...
- Publication number 20110043811
- Publication date Feb 24, 2011
- Takeshi Yamane
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND MANUFACTURING METH...
- Publication number 20100080647
- Publication date Apr 1, 2010
- RENESAS TECHNOLOGY CORP.
- Tsuneo TERASAWA
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and apparatus for measuring dimension of photomask pattern
- Publication number 20070201044
- Publication date Aug 30, 2007
- Takeshi Yamane
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Dimension measuring method, system and program
- Publication number 20040257568
- Publication date Dec 23, 2004
- Kabushiki Kaisha Toshiba
- Takeshi Yamane
- G06 - COMPUTING CALCULATING COUNTING

Takeshi YAMANE

Person

Patents Grantslast 30 patents

Image pickup device and image generation method

Particle detector, particle detection apparatus, and particle detec...

Imaging device, image generating device, and imaging method

Particle detection device and image generation apparatus

Particle detector, image generation device, and image generation me...

Superconducting element, particle detection device, and particle de...

Image acquisition apparatus and image acquisition method

Superconducting element, particle detection device, and particle de...

Imaging apparatus and imaging method

Method and apparatus for inspecting a mask substrate for defects, m...

Optimum imaging position detecting method, optimum imaging position...

Mask inspection method and mask inspection apparatus

Mask defect inspection method and defect inspection apparatus

Manufacturing method of semiconductor device and manufacturing meth...

Mask defect measurement method, mask quality determination and meth...

Method and apparatus for measuring dimension of photo-mask pattern

Patents Applicationslast 30 patents

IMAGING DEVICE AND IMAGE GENERATION METHOD

IMAGE PICKUP DEVICE AND IMAGE GENERATION METHOD

PARTICLE DETECTION DEVICE AND IMAGE GENERATION APPARATUS

PARTICLE DETECTOR, PARTICLE DETECTION APPARATUS, AND PARTICLE DETEC...

IMAGING DEVICE, IMAGE GENERATING DEVICE, AND IMAGING METHOD

IMAGE ACQUISITION APPARATUS AND IMAGE ACQUISITION METHOD

PARTICLE DETECTOR, IMAGE GENERATION DEVICE, AND IMAGE GENERATION ME...

SUPERCONDUCTING ELEMENT, PARTICLE DETECTION DEVICE, AND PARTICLE DE...

SUPERCONDUCTING ELEMENT, PARTICLE DETECTION DEVICE, AND PARTICLE DE...

IMAGING APPARATUS AND IMAGING METHOD

IMAGING APPARATUS AND IMAGING METHOD

Method and Apparatus for Inspecting a Mask Substrate for Defects, M...

Optimum Imaging Position Detecting Method, Optimum Imaging Position...

MASK INSPECTION METHOD AND MASK INSPECTION APPARATUS

MASK INSPECTION METHOD AND MASK INSPECTION APPARATUS

MASK DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS

MASK DEFECT MEASUREMENT METHOD, MASK QUALITY DETERMINATION METHOD,...

MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND MANUFACTURING METH...

Method and apparatus for measuring dimension of photomask pattern

Dimension measuring method, system and program