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TAKESHI YANAGIDA
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FUKUOKA, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for analyzing samples and device for analyzing samples
Patent number
11,169,071
Issue date
Nov 9, 2021
National University Corporation Nagoya University
Hirotoshi Yasaki
G01 - MEASURING TESTING
Information
Patent Grant
Device for electrical measurement and electrical measurement apparatus
Patent number
10,830,685
Issue date
Nov 10, 2020
National University Corporation Nagoya University
Yoshinobu Baba
G01 - MEASURING TESTING
Information
Patent Grant
Electrophoretic support body and electrophoretic device
Patent number
10,533,967
Issue date
Jan 14, 2020
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Hiroaki Oka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR ANALYZING SAMPLES AND DEVICE FOR ANALYZING SAMPLES
Publication number
20200033248
Publication date
Jan 30, 2020
NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
Hirotoshi YASAKI
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR ELECTRICAL MEASUREMENT AND ELECTRICAL MEASUREMENT APPARATUS
Publication number
20180100792
Publication date
Apr 12, 2018
NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
Yoshinobu BABA
G01 - MEASURING TESTING
Information
Patent Application
ELECTROPHORETIC SUPPORT BODY AND ELECTROPHORETIC DEVICE
Publication number
20180074014
Publication date
Mar 15, 2018
Panasonic Intellectual Property Management Co., Ltd.
HIROAKI OKA
G01 - MEASURING TESTING
Information
Patent Application
CHEMICAL SUBSTANCE CONCENTRATOR AND CHEMICAL SUBSTANCE DETECTING DE...
Publication number
20170212069
Publication date
Jul 27, 2017
Panasonic Intellectual Property Management Co., Ltd.
ATSUO NAKAO
G01 - MEASURING TESTING