TREA

Takeshi Yanase

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  • Kawasaki, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Test system for circuits
    • Patent number 7,096,396
    • Issue date Aug 22, 2006
    • Fujitsu Limited
    • Kouji Uesaka
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Test system for circuits
    • Publication number 20030233208
    • Publication date Dec 18, 2003
    • FUJITSU LIMITED
    • Kouji Uesaka
    • G01 - MEASURING TESTING