Takeshi YOGI

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Object exchange assistant system
- Patent number 11,922,477
- Issue date Mar 5, 2024
- PHOTONON INC.
- Takeshi Yogi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated analyzer and analyzing method
- Patent number 9,664,678
- Issue date May 30, 2017
- Hitachi High-Technologies Corporation
- Takeshi Yogi
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer and automatic analyzer
- Patent number 9,459,271
- Issue date Oct 4, 2016
- Hitachi High-Technologies Corporation
- Takeshi Yogi
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 8,858,882
- Issue date Oct 14, 2014
- Hitachi High-Technologies Corporation
- Sakuichiro Adachi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OBJECT EXCHANGE ASSISTANT SYSTEM
- Publication number 20240193662
- Publication date Jun 13, 2024
- Photonon Inc.
- Takeshi YOGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBJECT EXCHANGE ASSISTANT SYSTEM
- Publication number 20200184536
- Publication date Jun 11, 2020
- Photonon Inc.
- Takeshi YOGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYZER AND AUTOMATIC ANALYZER
- Publication number 20160025758
- Publication date Jan 28, 2016
- Hitachi High-Technologies Corporation
- Takeshi YOGI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYZER AND ANALYZING METHOD
- Publication number 20140220705
- Publication date Aug 7, 2014
- Hitachi High-Technologies Corporation
- Takeshi Yogi
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20120315190
- Publication date Dec 13, 2012
- Sakuichiro Adachi
- G01 - MEASURING TESTING