Takeyoshi MATSUDA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 9,960,572
- Issue date May 1, 2018
- Furukawa Electric Co., Ltd.
- Masayuki Iwami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of and apparatus for measuring lattice-constant, and compute...
- Patent number 6,593,153
- Issue date Jul 15, 2003
- The Furukawa Electric Co., Ltd.
- Takeyoshi Matsuda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20160351392
- Publication date Dec 1, 2016
- FURUKAWA ELECTRIC CO., LTD.
- Masayuki IWAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR LASER DEVICE
- Publication number 20160352075
- Publication date Dec 1, 2016
- FURUKAWA ELECTRIC CO., LTD.
- Masayuki IWAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of and apparatus for measuring lattice-constant, and compute...
- Publication number 20020166965
- Publication date Nov 14, 2002
- Takeyoshi Matsuda
- G01 - MEASURING TESTING