Takeyuki Yoshida

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern inspecting and measuring device and program
- Patent number 9,858,659
- Issue date Jan 2, 2018
- Hitachi High-Technologies Corporation
- Tsuyoshi Minakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit pattern examining apparatus and circuit pattern examining m...
- Patent number 8,509,516
- Issue date Aug 13, 2013
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and an inspection method for inspecting a circ...
- Patent number 8,121,395
- Issue date Feb 21, 2012
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Pattern Inspecting and Measuring Device and Program
- Publication number 20150228063
- Publication date Aug 13, 2015
- Hitachi High-Technologies Corporation
- Tsuyoshi Minakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20120045115
- Publication date Feb 23, 2012
- Shuangqi Dong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTING APPARATUS AND PATTERN INSPECTING METHOD
- Publication number 20110298915
- Publication date Dec 8, 2011
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT PATTERN EXAMINING APPARATUS AND CIRCUIT PATTERN EXAMINING M...
- Publication number 20110129141
- Publication date Jun 2, 2011
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND AN INSPECTION METHOD FOR INSPECTING A CIRC...
- Publication number 20090226075
- Publication date Sep 10, 2009
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING