Takuaki Sekiguchi

Person

Honjo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
System for monitoring foreign particles, process processing apparat...
- Patent number 8,254,662
- Issue date Aug 28, 2012
- Hitachi High-Technologies Corporation
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
System for monitoring foreign particles, process processing apparat...
- Patent number 8,045,148
- Issue date Oct 25, 2011
- Hitachi High-Technologies Corporation
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 7,953,567
- Issue date May 31, 2011
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 7,672,799
- Issue date Mar 2, 2010
- Hitachi High-Technologies Corporation
- Kei Shimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for monitoring foreign particles, process processing apparat...
- Patent number 7,499,157
- Issue date Mar 3, 2009
- Hitachi Electronics Engineering Co, Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
System for monitoring foreign particles, process processing apparat...
- Patent number 7,196,785
- Issue date Mar 27, 2007
- Hitachi High-Technologies Corporation
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INSPECTION APPARATUS AND EDGE INSPECTION DEVICE
- Publication number 20130100441
- Publication date Apr 25, 2013
- Hitachi High-Technologies Corporation
- Yuta TAGAWA
- G01 - MEASURING TESTING
Information Patent Application
System For Monitoring Foreign Particles, Process Processing Apparat...
- Publication number 20120002196
- Publication date Jan 5, 2012
- Hidetoshi Nishiyama
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20100106443
- Publication date Apr 29, 2010
- Hitachi High-Technologies Corporation
- Kei SHIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System For Monitoring Foreign Particles, Process Processing Apparat...
- Publication number 20090177413
- Publication date Jul 9, 2009
- Hidetoshi Nishiyama
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20080059094
- Publication date Mar 6, 2008
- Hitachi High-Technologies Corporation
- Kei SHIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System for monitoring foreign particles, process processing apparat...
- Publication number 20070165212
- Publication date Jul 19, 2007
- Hidetoshi Nishiyama
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
System for monitoring foreign particles, process processing apparat...
- Publication number 20040021856
- Publication date Feb 5, 2004
- Hidetoshi Nishiyama
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Takuaki Sekiguchi

Person

Patents Grantslast 30 patents

System for monitoring foreign particles, process processing apparat...

System for monitoring foreign particles, process processing apparat...

Defect inspection apparatus and defect inspection method

Defect inspection apparatus and defect inspection method

System for monitoring foreign particles, process processing apparat...

System for monitoring foreign particles, process processing apparat...

Patents Applicationslast 30 patents

OPTICAL INSPECTION APPARATUS AND EDGE INSPECTION DEVICE

System For Monitoring Foreign Particles, Process Processing Apparat...

Defect Inspection Apparatus and Defect Inspection Method

System For Monitoring Foreign Particles, Process Processing Apparat...

Defect Inspection Apparatus and Defect Inspection Method

System for monitoring foreign particles, process processing apparat...

System for monitoring foreign particles, process processing apparat...