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Takuji OIDA

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  • Kyoto-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Gas analyzing apparatus
    • Patent number 9,448,179
    • Issue date Sep 20, 2016
    • Horiba, Ltd.
    • Yusuke Mizuno
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Gas concentration measuring apparatus
    • Patent number 8,749,789
    • Issue date Jun 10, 2014
    • Horiba, Ltd.
    • Takuji Oida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Thermal conductivity sensor
    • Patent number 8,302,459
    • Issue date Nov 6, 2012
    • HORIBA, Ltd.
    • Makoto Matsuhama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Stack-gas measuring apparatus and stack-gas measuring method
    • Patent number 8,276,469
    • Issue date Oct 2, 2012
    • HORIBA, Ltd.
    • Shigeyuki Akiyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Absorbance monitor
    • Patent number 7,227,642
    • Issue date Jun 5, 2007
    • Horiba, Ltd.
    • Takuji Oida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Gas analyzing apparatus
    • Patent number 5,780,716
    • Issue date Jul 14, 1998
    • Horiba, Ltd.
    • Naohito Shimizu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Gas analyzer
    • Patent number 5,773,828
    • Issue date Jun 30, 1998
    • Horiba, Ltd.
    • Shigeyuki Akiyama
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents