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Takuma KATOU
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Kobe-shi, JP
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last 30 patents
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Patent Grant
Sample analyzer, sample analyzing method, and sample analyzing system
Patent number
9,513,282
Issue date
Dec 6, 2016
Sysmex Corporation
Takuma Katou
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SAMPLE ANALYZER, SAMPLE ANALYZING METHOD, AND SAMPLE ANALYZING SYSTEM
Publication number
20130262143
Publication date
Oct 3, 2013
SYSMEX CORPORATION
Takuma KATOU
G01 - MEASURING TESTING