Takuma Yamamoto

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Computer-readable recording medium storing learning program, learni...
- Patent number 12,198,408
- Issue date Jan 14, 2025
- Fujitsu Limited
- Takuma Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam system and overlay misalignment measurement m...
- Patent number 12,183,541
- Issue date Dec 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 12,174,551
- Issue date Dec 24, 2024
- Hitachi High-Technologies Corporation
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspecting device
- Patent number 12,176,181
- Issue date Dec 24, 2024
- HITACHI HIGH-TECH CORPORATION
- Wei Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 12,142,457
- Issue date Nov 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information processing device, information processing system, and n...
- Patent number 11,886,393
- Issue date Jan 30, 2024
- FUJIFILM Business Innovation Corp.
- Takuma Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, information processing system, an...
- Patent number 11,750,757
- Issue date Sep 5, 2023
- FUJIFILM Business Innovation Corp.
- Takuma Yamamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Charged particle beam device
- Patent number 11,728,127
- Issue date Aug 15, 2023
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information processing device and non-transitory computer readable...
- Patent number 11,706,171
- Issue date Jul 18, 2023
- FUJIFILM Business Innovation Corp.
- Takuma Yamamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Information processing apparatus and system and non-transitory comp...
- Patent number 11,656,806
- Issue date May 23, 2023
- FUJIFILM Business Innovation Corp.
- Takuma Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 11,626,266
- Issue date Apr 11, 2023
- HITACHI HIGH-TECH CORPORATION
- Keiichiro Hitomi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image processing apparatus, image processing method, and image proc...
- Patent number 11,610,327
- Issue date Mar 21, 2023
- Fujitsu Limited
- Takuma Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope
- Patent number 11,562,882
- Issue date Jan 24, 2023
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information processing device and non-transitory computer readable...
- Patent number 11,558,323
- Issue date Jan 17, 2023
- FUJIFILM Business Innovation Corp.
- Takuma Yamamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Scanning electron microscopy system and pattern depth measurement m...
- Patent number 11,545,336
- Issue date Jan 3, 2023
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information processing apparatus, and non-transitory computer reada...
- Patent number 11,412,102
- Issue date Aug 9, 2022
- FUJIFILM Business Innovation Corp.
- Takuma Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic microscope device
- Patent number 11,355,304
- Issue date Jun 7, 2022
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 11,353,798
- Issue date Jun 7, 2022
- Hitachi High-Technologies Corporation
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information processing apparatus, and non-transitory computer reada...
- Patent number 11,336,779
- Issue date May 17, 2022
- FUJIFILM Business Innovation Corp.
- Takuma Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscope apparatus, inspection system using electron mic...
- Patent number 11,302,513
- Issue date Apr 12, 2022
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 11,195,690
- Issue date Dec 7, 2021
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 11,133,148
- Issue date Sep 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Estimation system and automobile
- Patent number 11,019,322
- Issue date May 25, 2021
- Kabushiki Kaisha Toshiba
- Tatsuma Sakurai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 10,816,332
- Issue date Oct 27, 2020
- HITACHI HIGH-TECH CORPORATION
- Hiroya Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Pose estimation apparatus and vacuum cleaner system
- Patent number 10,375,376
- Issue date Aug 6, 2019
- Kabushiki Kaisha Toshiba
- Takuma Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing device, image processing method, computer program...
- Patent number 10,255,663
- Issue date Apr 9, 2019
- Kabushiki Kaisha Toshiba
- Junji Otsuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample observation device having a selectable acceleration voltage
- Patent number 10,141,159
- Issue date Nov 27, 2018
- Hitachi High-Technologies Corporation
- Ayumi Doi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image processing apparatus, image processing method, and image proc...
- Patent number 10,038,913
- Issue date Jul 31, 2018
- Kabushiki Kaisha Toshiba
- Takuma Yamamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Pattern inspecting and measuring device and program
- Patent number 9,858,659
- Issue date Jan 2, 2018
- Hitachi High-Technologies Corporation
- Tsuyoshi Minakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope system, pattern measurement method usi...
- Patent number 9,852,881
- Issue date Dec 26, 2017
- Hitachi High-Technologies Corporation
- Chie Shishido
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
COMPUTER-READABLE RECORDING MEDIUM, INFORMATION PROCESSING METHOD,...
- Publication number 20240211917
- Publication date Jun 27, 2024
- Fujitsu Limited
- Takuma YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING PROGRAM, INFORMATION PROCESSING METHOD, AND...
- Publication number 20240211952
- Publication date Jun 27, 2024
- Fujitsu Limited
- Yuya OBINATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE MEDIUM, ALERT GENERATION METHOD, AND INFORMATION PROCESSING...
- Publication number 20240212355
- Publication date Jun 27, 2024
- Fujitsu Limited
- Yuya OBINATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE MEDIUM, DATA GENERATION METHOD, AND INFORMATION PROCESSING...
- Publication number 20240212321
- Publication date Jun 27, 2024
- Fujitsu Limited
- Yuya OBINATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE MEDIUM, SPECIFYING METHOD, AND INFORMATION PROCESSING DEVICE
- Publication number 20240212320
- Publication date Jun 27, 2024
- Fujitsu Limited
- Yuya OBINATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RECORDING MEDIUM, ALERT GENERATION METHOD, AND INFORMATION PROCESSI...
- Publication number 20240212351
- Publication date Jun 27, 2024
- Fujitsu Limited
- Yuya OBINATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE MEDIUM, ALERT GENERATION METHOD, AND INFORMATION PROCESSING...
- Publication number 20240211920
- Publication date Jun 27, 2024
- Fujitsu Limited
- Yuya OBINATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTER-READABLE RECORDING MEDIUM STORING INFORMATION PROCESSING P...
- Publication number 20240203164
- Publication date Jun 20, 2024
- Fujitsu Limited
- Takuma YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Observation System and Overlay Measurement Method
- Publication number 20240112322
- Publication date Apr 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Takahiro NISHIHATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, NON-TRANSITORY COMPUTER READABLE...
- Publication number 20240070760
- Publication date Feb 29, 2024
- FUJIFILM Business Innovation Corp.
- Takuma YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20230411111
- Publication date Dec 21, 2023
- HITACHI HIGH-TECH CORPORATION
- Tetsuro KADOWAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND N...
- Publication number 20230409911
- Publication date Dec 21, 2023
- Fujitsu Limited
- Yuya OBINATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Measurement Device
- Publication number 20230375338
- Publication date Nov 23, 2023
- Hitachi High-Tech Corporation
- Long ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20230343548
- Publication date Oct 26, 2023
- HITACHI HIGH-TECH CORPORATION
- Takuma YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPUTER-READABLE RECORDING MEDIUM STORING INFORMATION PROCESSING P...
- Publication number 20230230357
- Publication date Jul 20, 2023
- Fujitsu Limited
- Takuma YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM, INFORMATION PROC...
- Publication number 20230206639
- Publication date Jun 29, 2023
- Fujitsu Limited
- Takuma YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE MEDIUM, INFORMATION PROCESSING METHOD, AND INFORMATION PROC...
- Publication number 20230206641
- Publication date Jun 29, 2023
- Fujitsu Limited
- Atsunori Moteki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM, INFORMATION PROC...
- Publication number 20230206694
- Publication date Jun 29, 2023
- Fujitsu Limited
- Yoshie KIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTER-READABLE RECORDING MEDIUM STORING LEARNING PROGRAM, LEARNI...
- Publication number 20230130674
- Publication date Apr 27, 2023
- Fujitsu Limited
- Takuma YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTER-READABLE RECORDING MEDIUM STORING INFERENCE PROGRAM, COMPU...
- Publication number 20230127469
- Publication date Apr 27, 2023
- Fujitsu Limited
- Takuma YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING DEVICE AND NON-TRANSITORY COMPUTER READABLE...
- Publication number 20230105788
- Publication date Apr 6, 2023
- FUJIFILM Business Innovation Corp.
- Takuma YAMAMOTO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INFORMATION PROCESSING APPARATUS AND SYSTEM AND NON-TRANSITORY COMP...
- Publication number 20230058537
- Publication date Feb 23, 2023
- FUJIFILM Buisiness Innovation Corp,
- Takuma YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING SYSTEM, AND N...
- Publication number 20230053643
- Publication date Feb 23, 2023
- FUJIFILM Business Innovation Corp.
- Takuma Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING SYSTEM, AN...
- Publication number 20230059572
- Publication date Feb 23, 2023
- FUJIFILM Business Innovation Corp.
- Takuma YAMAMOTO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD, APPARATUS, AND PROGRAM FOR DETERMINING CONDITION RELATED TO...
- Publication number 20230032587
- Publication date Feb 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Takahiro NISHIHATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220367147
- Publication date Nov 17, 2022
- Hitachi High-Tech Corporation
- Takahiro NISHIHATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN INSPECTING DEVICE
- Publication number 20220359151
- Publication date Nov 10, 2022
- Hitachi High-Tech Corporation
- Wei Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam System and Overlay Misalignment Measurement M...
- Publication number 20220301815
- Publication date Sep 22, 2022
- Hitachi High-Tech Corporation
- Takuma YAMAMOTO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Pattern Measurement Device and Pattern Measurement Method
- Publication number 20220260930
- Publication date Aug 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
PATTERN MEASUREMENT SYSTEM AND PATTERN MEASUREMENT METHOD
- Publication number 20220230842
- Publication date Jul 21, 2022
- HITACHI HIGH-TECH CORPORATION
- Wei SUN
- H01 - BASIC ELECTRIC ELEMENTS

Takuma Yamamoto

Person

Patents Grantslast 30 patents

Computer-readable recording medium storing learning program, learni...

Charged particle beam system and overlay misalignment measurement m...

Pattern measurement device and pattern measurement method

Pattern inspecting device

Charged particle beam device

Information processing device, information processing system, and n...

Information processing apparatus, information processing system, an...

Charged particle beam device

Information processing device and non-transitory computer readable...

Information processing apparatus and system and non-transitory comp...

Charged particle beam device

Image processing apparatus, image processing method, and image proc...

Scanning electron microscope

Information processing device and non-transitory computer readable...

Scanning electron microscopy system and pattern depth measurement m...

Information processing apparatus, and non-transitory computer reada...

Electronic microscope device

Pattern measurement device and pattern measurement method

Information processing apparatus, and non-transitory computer reada...

Electron microscope apparatus, inspection system using electron mic...

Charged particle beam device

Scanning electron microscope

Estimation system and automobile

Pattern measurement device and pattern measurement method

Pose estimation apparatus and vacuum cleaner system

Image processing device, image processing method, computer program...

Sample observation device having a selectable acceleration voltage

Image processing apparatus, image processing method, and image proc...

Pattern inspecting and measuring device and program

Scanning electron microscope system, pattern measurement method usi...

Patents Applicationslast 30 patents

COMPUTER-READABLE RECORDING MEDIUM, INFORMATION PROCESSING METHOD,...

INFORMATION PROCESSING PROGRAM, INFORMATION PROCESSING METHOD, AND...

STORAGE MEDIUM, ALERT GENERATION METHOD, AND INFORMATION PROCESSING...

STORAGE MEDIUM, DATA GENERATION METHOD, AND INFORMATION PROCESSING...

STORAGE MEDIUM, SPECIFYING METHOD, AND INFORMATION PROCESSING DEVICE

RECORDING MEDIUM, ALERT GENERATION METHOD, AND INFORMATION PROCESSI...

STORAGE MEDIUM, ALERT GENERATION METHOD, AND INFORMATION PROCESSING...

COMPUTER-READABLE RECORDING MEDIUM STORING INFORMATION PROCESSING P...

Semiconductor Observation System and Overlay Measurement Method

INFORMATION PROCESSING APPARATUS, NON-TRANSITORY COMPUTER READABLE...

Charged Particle Beam Apparatus

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND N...

Pattern Measurement Device

Charged Particle Beam Device

COMPUTER-READABLE RECORDING MEDIUM STORING INFORMATION PROCESSING P...

NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM, INFORMATION PROC...

STORAGE MEDIUM, INFORMATION PROCESSING METHOD, AND INFORMATION PROC...

NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM, INFORMATION PROC...

COMPUTER-READABLE RECORDING MEDIUM STORING LEARNING PROGRAM, LEARNI...

COMPUTER-READABLE RECORDING MEDIUM STORING INFERENCE PROGRAM, COMPU...

INFORMATION PROCESSING DEVICE AND NON-TRANSITORY COMPUTER READABLE...

INFORMATION PROCESSING APPARATUS AND SYSTEM AND NON-TRANSITORY COMP...

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING SYSTEM, AND N...

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING SYSTEM, AN...

METHOD, APPARATUS, AND PROGRAM FOR DETERMINING CONDITION RELATED TO...

CHARGED PARTICLE BEAM DEVICE

PATTERN INSPECTING DEVICE

Charged Particle Beam System and Overlay Misalignment Measurement M...

Pattern Measurement Device and Pattern Measurement Method

PATTERN MEASUREMENT SYSTEM AND PATTERN MEASUREMENT METHOD