Takumi Kumatabara

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Contactor and test method using contactor
- Patent number 7,825,676
- Issue date Nov 2, 2010
- Fujitsu Semiconductor Limited
- Daisuke Koizumi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Contactor for electronic components and test method using the same
- Patent number 7,518,388
- Issue date Apr 14, 2009
- Fujitsu Microelectronics Limited
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Grant
Contactor for electronic components and test method using the same
- Patent number 7,309,996
- Issue date Dec 18, 2007
- Fujitsu Limited
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Grant
Contactor having contact electrodes formed by laser processing
- Patent number 6,806,723
- Issue date Oct 19, 2004
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Contactor for electronic components and test method using the same
- Publication number 20080136433
- Publication date Jun 12, 2008
- Fujitsu Limited
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Application
Contactor and test method using contactor
- Publication number 20070252608
- Publication date Nov 1, 2007
- FUJITSU LIMITED
- Daisuke Koizumi
- G01 - MEASURING TESTING
Information Patent Application
Contactor for electronic components and test method using the same
- Publication number 20040239357
- Publication date Dec 2, 2004
- FUJITSU LIMITED
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Application
Contactor having contact electrodes formed by laser processing
- Publication number 20040032272
- Publication date Feb 19, 2004
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING