Takumi Okamoto

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method, apparatus, and system for analyzing operation of semiconduc...
- Patent number 8,341,579
- Issue date Dec 25, 2012
- NEC Corporation
- Takumi Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for hierarchical design of semiconductor integ...
- Patent number 8,141,022
- Issue date Mar 20, 2012
- NEC Corporation
- Takumi Okamoto
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
OPERATION ANALYZING METHOD, OPERATION ANALYZING APPARATUS, OPERATIO...
- Publication number 20110296369
- Publication date Dec 1, 2011
- Takumi Okamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for hierarchical design of semiconductor integ...
- Publication number 20090288054
- Publication date Nov 19, 2009
- Takumi Okamoto
- G06 - COMPUTING CALCULATING COUNTING