Takumi Sannomiya

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Kochi-Ken, JP

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Patents Grantslast 30 patents

Information Patent Grant
Transmission electron microscope
- Patent number 7,683,320
- Issue date Mar 23, 2010
- Jeol Ltd.
- Takumi Sannomiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring aberrations and correcting aberrations using Ro...
- Patent number 7,619,220
- Issue date Nov 17, 2009
- Jeol Ltd.
- Hidetaka Sawada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Transmission Electron Microscope
- Publication number 20080011949
- Publication date Jan 17, 2008
- JEOL Ltd.
- Takumi Sannomiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of measuring aberrations and correcting aberrations using ro...
- Publication number 20070120055
- Publication date May 31, 2007
- JEOL Ltd.
- Hidetaka Sawada
- G01 - MEASURING TESTING