Takumi YAMADA

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Patents Grantslast 30 patents

Information Patent Grant
Automated analysis device, and analysis method
- Patent number 12,203,951
- Issue date Jan 21, 2025
- HITACHI HIGH-TECH CORPORATION
- Takumi Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 11,747,355
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Chie Yabutani
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 11,156,625
- Issue date Oct 26, 2021
- HITACHI HIGH-TECH CORPORATION
- Chie Yabutani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Control Method for Automatic Analyzer
- Publication number 20240118251
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Takumi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20230408537
- Publication date Dec 21, 2023
- HITACHI HIGH-TECH CORPORATION
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
Automated Analysis Device, and Analysis Method
- Publication number 20220011330
- Publication date Jan 13, 2022
- Hitachi High-Tech Corporation
- Takumi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20220003794
- Publication date Jan 6, 2022
- HITACHI HIGH-TECH CORPORATION
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20200241024
- Publication date Jul 30, 2020
- Hitachi High-Technologies Corporation
- Chie YABUTANI
- G01 - MEASURING TESTING