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Takushi MIYAKAWA

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  • Tokyo, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20250004003
    • Publication date Jan 2, 2025
    • Hitachi High-Tech Corporation
    • Haruyoshi YAMAMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20240159789
    • Publication date May 16, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Yuichi Iwase
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Container Holder, Analyzer, and Method for Manufacturing Container...
    • Publication number 20240100534
    • Publication date Mar 28, 2024
    • Hitachi High-Tech Corporation
    • Hiroshi SUZUKI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    ELECTROLYTE ANALYZER
    • Publication number 20240094160
    • Publication date Mar 21, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Takushi MIYAKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Liquid Mixer, Electrolyte Analysis Device, and Liquid Mixing Method
    • Publication number 20230390716
    • Publication date Dec 7, 2023
    • Hitachi High-Tech Corporation
    • Mitsuhiro MATSUZAWA
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    ELECTROLYTE ANALYZER
    • Publication number 20230288439
    • Publication date Sep 14, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takushi MIYAKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20230251279
    • Publication date Aug 10, 2023
    • Hitachi High-Tech Corporation
    • Takahiro KUMAGAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROLYTE ANALYSIS APPARATUS
    • Publication number 20230044702
    • Publication date Feb 9, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Yuichi Iwase
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    ELECTROLYTE ANALYSIS APPARATUS
    • Publication number 20230032886
    • Publication date Feb 2, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takahiro KUMAGAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20220283195
    • Publication date Sep 8, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Hiromi HIRAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20220120774
    • Publication date Apr 21, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Akinao FUJITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS APPARATUS
    • Publication number 20220026387
    • Publication date Jan 27, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Masafumi MIYAKE
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROLYTE ANALYZING DEVICE
    • Publication number 20210349052
    • Publication date Nov 11, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Masaki Hara
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROLYTE ANALYZING DEVICE
    • Publication number 20210165009
    • Publication date Jun 3, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Takushi Miyakawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROLYTE ANALYZING DEVICE
    • Publication number 20210025909
    • Publication date Jan 28, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Takushi Miyakawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    NOZZLE CLEANER AND AUTOMATIC ANALYZER USING THE SAME
    • Publication number 20200009623
    • Publication date Jan 9, 2020
    • Hitachi High-Technologies Corporation
    • Takushi MIYAKAWA
    • B08 - CLEANING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20180188275
    • Publication date Jul 5, 2018
    • Hitachi High-Technologies Corporation
    • Kazuhiro NODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE, AND LID OPENING/CLOSING MECHANISM
    • Publication number 20180024154
    • Publication date Jan 25, 2018
    • Hitachi High-Technologies Corporation
    • Takushi MIYAKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    NOZZLE CLEANING METHOD AND AUTOMATED ANALYZER
    • Publication number 20160193622
    • Publication date Jul 7, 2016
    • Hitachi High-Technologies Corporation
    • Takushi MIYAKAWA
    • B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...