Takuto Inoue

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Kitakami-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 8,580,652
- Issue date Nov 12, 2013
- Kabushiki Kaisha Toshiba
- Atsuko Kawasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Edge detection method for transparent substrate by detecting non-li...
- Patent number 8,339,615
- Issue date Dec 25, 2012
- Kabushiki Kaisha Toshiba
- Masayuki Dohi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MANUFACTURING METAL WIRING AND METHOD FOR MANUFACTURING...
- Publication number 20150263057
- Publication date Sep 17, 2015
- KABUSHIKI KAISHA TOSHIBA
- Masaharu OGASAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20110068476
- Publication date Mar 24, 2011
- Atsuko KAWASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EDGE DETECTION METHOD
- Publication number 20100027032
- Publication date Feb 4, 2010
- Kabushiki Kaisha Toshiba
- Masayuki Dohi
- G01 - MEASURING TESTING