Takuto Sakumura

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Processing apparatus, sysyem, X-ray measurement method, and program
- Patent number 11,221,423
- Issue date Jan 11, 2022
- Rigaku Corporation
- Shintaro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Detector
- Patent number 11,049,897
- Issue date Jun 29, 2021
- Rigaku Corporation
- Takuto Sakumura
- G01 - MEASURING TESTING
Information Patent Grant
Processing apparatus, method, and program
- Patent number 10,748,253
- Issue date Aug 18, 2020
- Rigaku Corporation
- Takuto Sakumura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing apparatus, method of obtaining characteristic of ea...
- Patent number 10,551,510
- Issue date Feb 4, 2020
- Rigaku Corporation
- Takuto Sakumura
- G01 - MEASURING TESTING
Information Patent Grant
X-ray data processing apparatus and method and program for the same
- Patent number 10,222,491
- Issue date Mar 5, 2019
- Rigaku Corporation
- Kazuyuki Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
X-ray data processing apparatus, X-ray data processing method, and...
- Patent number 10,209,375
- Issue date Feb 19, 2019
- Rigaku Corporation
- Kazuyuki Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
X-ray data processing apparatus and method and program therefor
- Patent number 10,101,476
- Issue date Oct 16, 2018
- Rigaku Corporation
- Takuto Sakumura
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector, and X-ray analysis apparatus and radiation dete...
- Patent number 9,945,961
- Issue date Apr 17, 2018
- Rigaku Corporation
- Takuto Sakumura
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector
- Patent number 9,583,530
- Issue date Feb 28, 2017
- Rigaku Corporation
- Yuji Tsuji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image processing method and image processing apparatus
- Patent number 9,558,582
- Issue date Jan 31, 2017
- Rigaku Corporation
- Takuto Sakumura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Correction information generation method and correction information...
- Patent number 9,341,583
- Issue date May 17, 2016
- Rigaku Corporation
- Takuto Sakumura
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector
- Patent number 9,134,431
- Issue date Sep 15, 2015
- Rigaku Corporation
- Akira Tsukiyama
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Radiation detector
- Patent number 8,866,094
- Issue date Oct 21, 2014
- Rigaku Corporation
- Akira Tsukiyama
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength-classifying type X-ray diffraction device
- Patent number 8,699,665
- Issue date Apr 15, 2014
- Rigaku Corporation
- Kazuyuki Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength-classifying type X-ray diffraction device
- Patent number 8,300,767
- Issue date Oct 30, 2012
- Rigaku Corporation
- Kazuyuki Matsushita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RADIATION DETECTOR, RADIATION MEASURING APPARATUS, AND METHOD FOR S...
- Publication number 20240280714
- Publication date Aug 22, 2024
- Rigaku Corporation
- Kunitoshi YANAGIHARA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR, TRIGGER SIGNAL GENERATOR, AND RADIATION ANALYZI...
- Publication number 20240280711
- Publication date Aug 22, 2024
- Rigaku Corporation
- Yasutaka SAKUMA
- G01 - MEASURING TESTING
Information Patent Application
CONTROL APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20230115151
- Publication date Apr 13, 2023
- Rigaku Corporation
- Takuto SAKUMURA
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING APPARATUS, SYSYEM, X-RAY MEASUREMENT METHOD, AND PROGRAM
- Publication number 20210124066
- Publication date Apr 29, 2021
- Rigaku Corporation
- Shintaro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR
- Publication number 20190245000
- Publication date Aug 8, 2019
- Rigaku Corporation
- TAKUTO SAKUMURA
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING APPARATUS, METHOD, AND PROGRAM
- Publication number 20190114746
- Publication date Apr 18, 2019
- Rigaku Corporation
- Takuto SAKUMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA PROCESSING APPARATUS, METHOD OF OBTAINING CHARACTERISTIC OF EA...
- Publication number 20180203132
- Publication date Jul 19, 2018
- Rigaku Corporation
- Takuto SAKUMURA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR, AND X-RAY ANALYSIS APPARATUS AND RADIATION DETE...
- Publication number 20170371044
- Publication date Dec 28, 2017
- Rigaku Corporation
- Takuto SAKUMURA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DATA PROCESSING APPARATUS AND METHOD AND PROGRAM FOR THE SAME
- Publication number 20160377749
- Publication date Dec 29, 2016
- Rigaku Corporation
- Kazuyuki MATSUSHITA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DATA PROCESSING APPARATUS AND METHOD AND PROGRAM THEREFOR
- Publication number 20160377748
- Publication date Dec 29, 2016
- Rigaku Corporation
- Takuto SAKUMURA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING METHOD AND IMAGE PROCESSING APPARATUS
- Publication number 20150213623
- Publication date Jul 30, 2015
- Rigaku Corporation
- Takuto SAKUMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIATION DETECTOR, AND X-RAY ANALYSIS APPARATUS AND RADIATION DETE...
- Publication number 20150212213
- Publication date Jul 30, 2015
- Rigaku Corporation
- Takuto SAKUMURA
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION INFORMATION GENERATION METHOD AND CORRECTION INFORMATION...
- Publication number 20150146960
- Publication date May 28, 2015
- Rigaku Corporation
- Takuto SAKUMURA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DATA PROCESSING APPARATUS, X-RAY DATA PROCESSING METHOD, AND...
- Publication number 20140236523
- Publication date Aug 21, 2014
- Rigaku Corporation
- Kazuyuki MATSUSHITA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR
- Publication number 20140203182
- Publication date Jul 24, 2014
- Rigaku Corporation
- Akira Tsukiyama
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR
- Publication number 20140131588
- Publication date May 15, 2014
- Rigaku Corporation
- Akira Tsukiyama
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH-CLASSIFYING TYPE X-RAY DIFFRACTION DEVICE
- Publication number 20120269322
- Publication date Oct 25, 2012
- Rigaku Corporation
- Kazuyuki MATSUSHITA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR
- Publication number 20120161027
- Publication date Jun 28, 2012
- Rigaku Corporation
- Akira TSUKIYAMA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
X-RAY DETECTOR
- Publication number 20120161019
- Publication date Jun 28, 2012
- Rigaku Corporation
- Yuji TSUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVELENGTH-CLASSIFYING TYPE X-RAY DIFFRACTION DEVICE
- Publication number 20110317813
- Publication date Dec 29, 2011
- Rigaku Corporation
- Kazuyuki MATSUSHITA
- G01 - MEASURING TESTING

Takuto Sakumura

Person

Patents Grantslast 30 patents

Processing apparatus, sysyem, X-ray measurement method, and program

Detector

Processing apparatus, method, and program

Data processing apparatus, method of obtaining characteristic of ea...

X-ray data processing apparatus and method and program for the same

X-ray data processing apparatus, X-ray data processing method, and...

X-ray data processing apparatus and method and program therefor

Radiation detector, and X-ray analysis apparatus and radiation dete...

X-ray detector

Image processing method and image processing apparatus

Correction information generation method and correction information...

Radiation detector

Radiation detector

Wavelength-classifying type X-ray diffraction device

Wavelength-classifying type X-ray diffraction device

Patents Applicationslast 30 patents

RADIATION DETECTOR, RADIATION MEASURING APPARATUS, AND METHOD FOR S...

RADIATION DETECTOR, TRIGGER SIGNAL GENERATOR, AND RADIATION ANALYZI...

CONTROL APPARATUS, SYSTEM, METHOD, AND PROGRAM

PROCESSING APPARATUS, SYSYEM, X-RAY MEASUREMENT METHOD, AND PROGRAM

DETECTOR

PROCESSING APPARATUS, METHOD, AND PROGRAM

DATA PROCESSING APPARATUS, METHOD OF OBTAINING CHARACTERISTIC OF EA...

RADIATION DETECTOR, AND X-RAY ANALYSIS APPARATUS AND RADIATION DETE...

X-RAY DATA PROCESSING APPARATUS AND METHOD AND PROGRAM FOR THE SAME

X-RAY DATA PROCESSING APPARATUS AND METHOD AND PROGRAM THEREFOR

IMAGE PROCESSING METHOD AND IMAGE PROCESSING APPARATUS

RADIATION DETECTOR, AND X-RAY ANALYSIS APPARATUS AND RADIATION DETE...

CORRECTION INFORMATION GENERATION METHOD AND CORRECTION INFORMATION...

X-RAY DATA PROCESSING APPARATUS, X-RAY DATA PROCESSING METHOD, AND...

RADIATION DETECTOR

RADIATION DETECTOR

WAVELENGTH-CLASSIFYING TYPE X-RAY DIFFRACTION DEVICE

X-RAY DETECTOR

X-RAY DETECTOR

WAVELENGTH-CLASSIFYING TYPE X-RAY DIFFRACTION DEVICE