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Takuya FUJII
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Kobe-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Sample analyzer, sample analyzing method, and reagent container holder
Patent number
11,796,550
Issue date
Oct 24, 2023
Sysmex Corporation
Takuya Fujii
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Reagent container rack and specimen analyzer
Patent number
11,772,100
Issue date
Oct 3, 2023
Sysmex Corporation
Takuya Fujii
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Sample analyzer, sample analyzing method, and reagent container holder
Patent number
10,591,500
Issue date
Mar 17, 2020
SYSMEX CORPORATION
Takuya Fujii
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SAMPLE ANALYZER, SAMPLE ANALYZING METHOD, AND REAGENT CONTAINER HOLDER
Publication number
20200174031
Publication date
Jun 4, 2020
SYSMEX CORPORATION
Takuya FUJII
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
REAGENT CONTAINER RACK AND SPECIMEN ANALYZER
Publication number
20200101464
Publication date
Apr 2, 2020
SYSMEX CORPORATION
Takuya FUJII
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER, SAMPLE ANALYZING METHOD, AND REAGENT CONTAINER HOLDER
Publication number
20170176482
Publication date
Jun 22, 2017
SYSMEX CORPORATION
Takuya FUJII
G01 - MEASURING TESTING