Takuya Hasumi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Delay lock loop circuit, timing generator, semiconductor test devic...
- Patent number 8,058,891
- Issue date Nov 15, 2011
- Advantest Corp.
- Takuya Hasumi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Delay circuit, test apparatus, storage medium semiconductor chip, i...
- Patent number 7,987,062
- Issue date Jul 26, 2011
- Advantest Corporation
- Kazuhiro Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Variable delay circuit, testing apparatus, and electronic device
- Patent number 7,755,407
- Issue date Jul 13, 2010
- Advantest Corporation
- Takuya Hasumi
- G01 - MEASURING TESTING
Information Patent Grant
Load fluctuation correction circuit, electronic device, testing dev...
- Patent number 7,714,600
- Issue date May 11, 2010
- Advantest Corporation
- Takuya Hasumi
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Delay Lock Loop Circuit, Timing Generator, Semiconductor Test Devic...
- Publication number 20090256577
- Publication date Oct 15, 2009
- Takuya Hasumi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
VARIABLE DELAY CIRCUIT, TESTING APPARATUS, AND ELECTRONIC DEVICE
- Publication number 20090039939
- Publication date Feb 12, 2009
- Advantest Corporation
- TAKUYA HASUMI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DELAY CIRCUIT, TEST APPARATUS, STORAGE MEDIUM SEMICONDUCTOR CHIP, I...
- Publication number 20080048750
- Publication date Feb 28, 2008
- Advantest Corporation
- Kazuhiro Fujita
- G01 - MEASURING TESTING
Information Patent Application
Load fluctuation correction circuit, electronic device, testing dev...
- Publication number 20060217912
- Publication date Sep 28, 2006
- Advantest Corporation
- Takuya Hasumi
- H03 - BASIC ELECTRONIC CIRCUITRY