Takuya KANBAYASHI

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical analysis apparatus, optical analysis system, and optical an...
- Patent number 10,663,399
- Issue date May 26, 2020
- Hitachi, Ltd.
- Takuya Kanbayashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical analysis apparatus, optical analysis system, and optical an...
- Patent number 10,627,348
- Issue date Apr 21, 2020
- Hitachi, Ltd.
- Takuya Kanbayashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical analysis system and optical analysis method
- Patent number 10,234,387
- Issue date Mar 19, 2019
- Hitachi, Ltd.
- Takuya Kanbayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL ANALYSIS APPARATUS, OPTICAL ANALYSIS SYSTEM, AND OPTICAL AN...
- Publication number 20180224374
- Publication date Aug 9, 2018
- Hitachi, Ltd.
- Takuya KANBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Optical Analysis System and Optical Analysis Method
- Publication number 20180172584
- Publication date Jun 21, 2018
- Hitachi, Ltd
- Takuya KANBAYASHI
- G01 - MEASURING TESTING