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Takuya Karube
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Osaka, JP
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Patents Grants
last 30 patents
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Patent Grant
Three-dimensional shape measuring apparatus, three-dimensional shap...
Patent number
11,493,331
Issue date
Nov 8, 2022
Keyence Corporation
Takuya Karube
G01 - MEASURING TESTING
Information
Patent Grant
Magnifying observation apparatus
Patent number
10,539,775
Issue date
Jan 21, 2020
Kerence Corporation
Shunsuke Tanaka
G02 - OPTICS
Information
Patent Grant
Magnifying observation apparatus, magnified image observing method...
Patent number
9,690,088
Issue date
Jun 27, 2017
Keyence Corporation
Takuya Karube
G02 - OPTICS
Information
Patent Grant
Magnifying observation apparatus, magnified image observing method...
Patent number
9,690,089
Issue date
Jun 27, 2017
Keyence Corporation
Takuya Karube
G02 - OPTICS
Information
Patent Grant
Microscope system, focus position detection method, and focus posit...
Patent number
9,140,887
Issue date
Sep 22, 2015
Keyence Corporation
Takuya Karube
G02 - OPTICS
Information
Patent Grant
Microscope system, surface state observing method, and surface stat...
Patent number
8,994,808
Issue date
Mar 31, 2015
Keyence Corporation
Yoichi Okamoto
G02 - OPTICS
Patents Applications
last 30 patents
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Patent Application
THREE-DIMENSIONAL SHAPE MEASURING APPARATUS, THREE-DIMENSIONAL SHAP...
Publication number
20210041231
Publication date
Feb 11, 2021
KEYENCE CORPORATION
Takuya KARUBE
G01 - MEASURING TESTING
Information
Patent Application
Magnifying Observation Apparatus
Publication number
20190113734
Publication date
Apr 18, 2019
KEYENCE CORPORATION
Shunsuke Tanaka
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Magnifying Observation Apparatus, Magnified Image Observing Method...
Publication number
20150185465
Publication date
Jul 2, 2015
KEYENCE CORPORATION
Takuya Karube
G02 - OPTICS
Information
Patent Application
Magnifying Observation Apparatus, Magnified Image Observing Method...
Publication number
20150185464
Publication date
Jul 2, 2015
KEYENCE CORPORATION
Takuya Karube
G02 - OPTICS
Information
Patent Application
Microscope System, Surface State Observing Method, And Surface Stat...
Publication number
20120188360
Publication date
Jul 26, 2012
KEYENCE CORPORATION
Yoichi Okamoto
G02 - OPTICS
Information
Patent Application
Microscope System, Focus Position Detection Method, And Focus Posit...
Publication number
20120188359
Publication date
Jul 26, 2012
KEYENCE CORPORATION
Takuya Karube
G02 - OPTICS