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Takuya LEE

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Multiple core analysis mode for defect analysis
    • Patent number 10,664,370
    • Issue date May 26, 2020
    • Renesas Electronics Corporation
    • Kenji Shiozawa
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Semiconductor device
    • Patent number 10,656,201
    • Issue date May 19, 2020
    • Renesas Electronics Corporation
    • Takuya Lee
    • G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20190004914
    • Publication date Jan 3, 2019
    • RENESAS ELECTRONICS CORPORATION
    • Kenji SHIOZAWA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20190004110
    • Publication date Jan 3, 2019
    • RENESAS ELECTRONICS CORPORATION
    • Takuya LEE
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE
    • Publication number 20180364297
    • Publication date Dec 20, 2018
    • RENESAS ELECTRONICS CORPORATION
    • Yoshihide NAKAMURA
    • G01 - MEASURING TESTING