Takuya Nakamura

Person

Hamamatsu, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Low jitter trigger circuit for electro-optic probing apparatus
- Patent number 5,847,570
- Issue date Dec 8, 1998
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detection apparatus
- Patent number 5,703,491
- Issue date Dec 30, 1997
- Hamamatsu Photonics K.K.
- Takuya Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detection apparatus
- Patent number 5,583,444
- Issue date Dec 10, 1996
- Hamamatsu Photonics K.K.
- Takuya Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detection apparatus using short pulse light source with nar...
- Patent number 5,289,114
- Issue date Feb 22, 1994
- Hamamatsu Photonics K.K.
- Takuya Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Low noise pulsed light source utilizing laser diode and voltage det...
- Patent number 5,179,565
- Issue date Jan 12, 1993
- Hamamatsu Photonics, K.K.
- Yutaka Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detecting device
- Patent number 5,164,667
- Issue date Nov 17, 1992
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Low noise pulsed light source using laser diode
- Patent number 5,128,950
- Issue date Jul 7, 1992
- Hamamatsu Photonics K.K.
- Yutaka Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Optical signal detector incorporating means for eluminating backgro...
- Patent number 5,043,568
- Issue date Aug 27, 1991
- Hamamatsu Photonics K.K.
- Yutaka Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detecting device
- Patent number 4,982,152
- Issue date Jan 1, 1991
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detector using a sampling type high-speed photodetector
- Patent number 4,975,635
- Issue date Dec 4, 1990
- Takahashi; Hironori
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detecting device
- Patent number 4,973,900
- Issue date Nov 27, 1990
- Hamamatsu Photonics K.K.
- Shinichiro Aoshima
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detector
- Patent number 4,922,186
- Issue date May 1, 1990
- Hamamatsu Photonics Kabushiki Kaisha
- Yutaka Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed laser stabilizing device
- Patent number 4,866,721
- Issue date Sep 12, 1989
- Hamamatsu Photonics Kabushiki Kaisha
- Shinichiro Aoshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage detector using electro-optic material and interference of l...
- Patent number 4,864,220
- Issue date Sep 5, 1989
- Hamamatsu Photonics Kabushiki Kaisha
- Shinichiro Aoshima
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical voltage detector
- Patent number 4,855,591
- Issue date Aug 8, 1989
- Hamamatsu Photonics Kabushiki Kaisha
- Takuya Nakamura
- G01 - MEASURING TESTING

Takuya Nakamura

Person

Patents Grantslast 30 patents

Low jitter trigger circuit for electro-optic probing apparatus

Voltage detection apparatus

Voltage detection apparatus

Voltage detection apparatus using short pulse light source with nar...

Low noise pulsed light source utilizing laser diode and voltage det...

Voltage detecting device

Low noise pulsed light source using laser diode

Optical signal detector incorporating means for eluminating backgro...

Voltage detecting device

Voltage detector using a sampling type high-speed photodetector

Voltage detecting device

Voltage detector

Pulsed laser stabilizing device

Voltage detector using electro-optic material and interference of l...

Electro-optical voltage detector