Takuya Saeki

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometer, method of mass spectrometry and program for mass...
- Patent number 8,030,611
- Issue date Oct 4, 2011
- Hitachi High-Technologies Corporation
- Yoshinori Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap time-of-flight mass spectrometer
- Patent number 7,755,035
- Issue date Jul 13, 2010
- Hitachi High-Technologies Corporation
- Hiroshi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Mass spectrometer, method of mass spectrometry and program for mass...
- Publication number 20090236516
- Publication date Sep 24, 2009
- Hitachi High-Technologies Corporation
- Yoshinori Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap time-of-flight mass spectrometer
- Publication number 20080245962
- Publication date Oct 9, 2008
- Hitachi High-Technologies Corporation
- Hiroshi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS