Takuya Suzuki

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Ehime, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analysis device, and analysis apparatus and method using the same
- Patent number 8,415,140
- Issue date Apr 9, 2013
- Panasonic Corporation
- Hiroshi Saiki
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus
- Patent number 8,289,529
- Issue date Oct 16, 2012
- Panasonic Corporation
- Masatake Hyoudou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYSIS DEVICE AND METHOD USING THE SAME
- Publication number 20130164763
- Publication date Jun 27, 2013
- PANASONIC CORPORATION
- Hiroshi Saiki
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING APPARATUS
- Publication number 20100309487
- Publication date Dec 9, 2010
- PANASONIC CORPORATION
- Masatake Hyoudou
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE, AND ANALYSIS APPARATUS AND METHOD USING THE SAME
- Publication number 20100221741
- Publication date Sep 2, 2010
- PANASONIC CORPORATION
- Hiroshi Saiki
- G01 - MEASURING TESTING