Takuya Tamano

Follow

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test mode security circuit
- Patent number 12,100,476
- Issue date Sep 24, 2024
- Micron Technology, Inc.
- Kari Crane
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for testing redundant fuse latches in a memory...
- Patent number 12,100,467
- Issue date Sep 24, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
Self-repair verification
- Patent number 11,791,011
- Issue date Oct 17, 2023
- Micron Technology, Inc.
- Takuya Tamano
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TEST MODE SECURITY CIRCUIT
- Publication number 20240087625
- Publication date Mar 14, 2024
- Micron Technology, Inc.
- Kari Crane
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR TESTING REDUNDANT FUSE LATCHES IN A MEMORY...
- Publication number 20240071560
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS WITH ADJUSTABLE DIAGNOSTIC MECHANISM AND METHODS FOR OPER...
- Publication number 20240021262
- Publication date Jan 18, 2024
- Micron Technology, Inc.
- Takuya Tamano
- G11 - INFORMATION STORAGE
Information Patent Application
SELF-REPAIR VERIFICATION
- Publication number 20230360718
- Publication date Nov 9, 2023
- Micron Technology, Inc.
- Takuya Tamano
- G11 - INFORMATION STORAGE