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Tal RAICHMAN
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San Francisco, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Modified current source (MCS) with seamless range switching
Patent number
7,812,589
Issue date
Oct 12, 2010
Qualitau, Inc.
James Borthwick
G01 - MEASURING TESTING
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Patent Grant
Dual channel source measurement unit for semiconductor device testing
Patent number
7,151,389
Issue date
Dec 19, 2006
QualiTau, Inc.
Tal Raichman
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
MODIFIED CURRENT SOURCE (MCS) WITH SEAMLESS RANGE SWITCHING
Publication number
20100052633
Publication date
Mar 4, 2010
QUALITAU, INC.
James BORTHWICK
G01 - MEASURING TESTING
Information
Patent Application
Dual channel source measurement unit for semiconductor device testing
Publication number
20050194963
Publication date
Sep 8, 2005
QualiTau, Inc.
Tal Raichman
G01 - MEASURING TESTING