Talat Fatima Hasan

Person

Saratoga, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement system cluster
- Patent number 7,283,226
- Issue date Oct 16, 2007
- Tokyo Electron Limited
- Talat Fatima Hasan
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for metrology recipe and model generation
- Patent number 7,254,458
- Issue date Aug 7, 2007
- Tokyo Electron Limited
- Talat Fatima Hasan
- G05 - CONTROLLING REGULATING
Information Patent Grant
Measurement system cluster
- Patent number 7,106,433
- Issue date Sep 12, 2006
- Tokyo Electron Limited
- Talat Fatima Hasan
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for metrology recipe and model generation
- Patent number 7,089,075
- Issue date Aug 8, 2006
- Tokyo Electron Limited
- Talat Fatima Hasan
- G05 - CONTROLLING REGULATING
Information Patent Grant
Measurement system cluster
- Patent number 6,999,164
- Issue date Feb 14, 2006
- Tokyo Electron Limited
- Talat Fatima Hasan
- G01 - MEASURING TESTING
Information Patent Grant
Integrated surface metrology
- Patent number 6,829,054
- Issue date Dec 7, 2004
- Sensys Instruments Corporation
- Fred E. Stanke
- B24 - GRINDING POLISHING
Information Patent Grant
Integrated surface metrology
- Patent number 6,690,473
- Issue date Feb 10, 2004
- Sensys Instruments Corporation
- Fred E. Stanke
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus and method for characterizing semiconductor wafers during...
- Patent number 6,182,510
- Issue date Feb 6, 2001
- Sensys Instruments Corporation
- Fred E. Stanke
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for characterizing semiconductor wafers during...
- Patent number 6,112,595
- Issue date Sep 5, 2000
- Sensys Instruments Corporation
- Fred E. Stanke
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for characterizing semiconductor wafers during...
- Patent number 5,996,415
- Issue date Dec 7, 1999
- Sensys Instruments Corporation
- Fred E. Stanke
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measurement system cluster
- Publication number 20060274306
- Publication date Dec 7, 2006
- Tokyo Electronic Limited
- Talat Fatima Hasan
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for metrology recipe and model generation
- Publication number 20060247818
- Publication date Nov 2, 2006
- Talat Fatima Hasan
- G05 - CONTROLLING REGULATING
Information Patent Application
Measurement system cluster
- Publication number 20050094138
- Publication date May 5, 2005
- Talat Fatima Hasan
- G01 - MEASURING TESTING
Information Patent Application
Integrated surface metrology
- Publication number 20040080757
- Publication date Apr 29, 2004
- Fred E. Stanke
- B24 - GRINDING POLISHING
Information Patent Application
Measurement system cluster
- Publication number 20020176074
- Publication date Nov 28, 2002
- Talat Fatima Hasan
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for metrology recipe and model generation
- Publication number 20020165636
- Publication date Nov 7, 2002
- Talat Fatima Hasan
- G05 - CONTROLLING REGULATING

Talat Fatima Hasan

Person

Patents Grantslast 30 patents

Measurement system cluster

Systems and methods for metrology recipe and model generation

Measurement system cluster

Systems and methods for metrology recipe and model generation

Measurement system cluster

Integrated surface metrology

Integrated surface metrology

Apparatus and method for characterizing semiconductor wafers during...

Apparatus and method for characterizing semiconductor wafers during...

Apparatus and method for characterizing semiconductor wafers during...

Patents Applicationslast 30 patents

Measurement system cluster

Systems and methods for metrology recipe and model generation

Measurement system cluster

Integrated surface metrology

Measurement system cluster

Systems and methods for metrology recipe and model generation