Tamiko ASANO

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Hino-city, JP

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Patents Grantslast 30 patents

Information Patent Grant
Evaluation method, estimation method, evaluation apparatus, and com...
- Patent number 11,506,701
- Issue date Nov 22, 2022
- Fuji Electric Co., Ltd.
- Miwako Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation method, combined evaluation method, evaluation apparatus...
- Patent number 11,162,993
- Issue date Nov 2, 2021
- Fuji Electric Co., Ltd.
- Hiroki Katsumata
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation method, estimation method, evaluation apparatus, and com...
- Patent number 11,143,691
- Issue date Oct 12, 2021
- Fuji Electric Co., Ltd.
- Hiroki Katsumata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MODULE
- Publication number 20230060703
- Publication date Mar 2, 2023
- Fuji Electric Co., Ltd.
- Tamiko ASANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATION METHOD, ESTIMATION METHOD, EVALUATION APPARATUS, AND COM...
- Publication number 20200217884
- Publication date Jul 9, 2020
- Fuji Electric Co., Ltd.
- Miwako FUJITA
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION METHOD, ESTIMATION METHOD, EVALUATION APPARATUS, AND COM...
- Publication number 20190170807
- Publication date Jun 6, 2019
- Fuji Electric Co., Ltd.
- Hiroki KATSUMATA
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION METHOD, COMBINED EVALUATION METHOD, EVALUATION APPARATUS...
- Publication number 20190170798
- Publication date Jun 6, 2019
- Fuji Electric Co., Ltd.
- Hiroki KATSUMATA
- G01 - MEASURING TESTING