Tamio Hara

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray generating apparatus and X-ray microscope
- Patent number 6,157,701
- Issue date Dec 5, 2000
- Shimadzu Corporation
- Hideo Hirose
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Lens system with multiple focal lines
- Patent number 5,991,082
- Issue date Nov 23, 1999
- Nikon Corporation
- Teruyoshi Tsunashima
- G02 - OPTICS
Information Patent Grant
X-ray microscope
- Patent number 5,832,052
- Issue date Nov 3, 1998
- Shimadzu Corporation
- Hideo Hirose
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray generating apparatus and X-ray microscope
- Patent number 5,680,429
- Issue date Oct 21, 1997
- Shimadzu Corporation
- Hideo Hirose
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Electron beam excited ion irradiation apparatus
- Patent number 5,326,981
- Issue date Jul 5, 1994
- Kawasaki Jukogyo Kabushiki Kaisha
- Tamio Hara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion-producing apparatus
- Patent number 4,749,912
- Issue date Jun 7, 1988
- Rikagaku Kenkyusho
- Tamio Hara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam-excited ion beam source
- Patent number 4,749,910
- Issue date Jun 7, 1988
- Rikagaku Kenkyusho
- Tamio Hara
- H01 - BASIC ELECTRIC ELEMENTS