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Tamotsu Sasaki
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Tokyo, JP
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last 30 patents
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Patent Grant
Alignment apparatus and alignment method
Patent number
8,205,349
Issue date
Jun 26, 2012
Tokyo Ohka Kogyo Co., Ltd.
Akihiko Nakamura
G01 - MEASURING TESTING
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Patent Grant
Multi-stage type processing apparatus
Patent number
7,166,184
Issue date
Jan 23, 2007
Tokyo Ohka Kogyo Co., Ltd.
Akihiko Nakamura
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Patents Applications
last 30 patents
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Patent Application
ALIGNMENT APPARATUS AND ALIGNMENT METHOD
Publication number
20100319209
Publication date
Dec 23, 2010
Akihiko NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
Multi-stage type processing apparatus
Publication number
20040179173
Publication date
Sep 16, 2004
Tokyo Ohka Kogyo Co., Ltd.
Akihiko Nakamura
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY