Tan Q. Thai

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Albuquerque, NM, US

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Patents Grantslast 30 patents

Information Patent Grant
Test circuits for integrated circuit counterfeit detection
- Patent number 10,254,334
- Issue date Apr 9, 2019
- National Technology & Engineering Solutions of Sandia, LLC
- Ryan Helinski
- G01 - MEASURING TESTING
Information Patent Grant
Test circuits for integrated circuit counterfeit detection
- Patent number 10,060,973
- Issue date Aug 28, 2018
- National Technology & Engineering Solutions of Sandia, LLC
- Ryan Helinski
- G01 - MEASURING TESTING
Information Patent Grant
Network testbed creation and validation
- Patent number 9,628,339
- Issue date Apr 18, 2017
- Sandia Corporation
- Tan Q. Thai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Network testbed creation and validation
- Patent number 9,600,386
- Issue date Mar 21, 2017
- Sandia Corporation
- Tan Q. Thai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TEST CIRCUITS FOR INTEGRATED CIRCUIT COUNTERFEIT DETECTION
- Publication number 20180328984
- Publication date Nov 15, 2018
- National Technology & Engineering Solutions of Sandia, LLC
- Ryan Helinski
- H04 - ELECTRIC COMMUNICATION TECHNIQUE