Tan Van Chu

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for detecting single event latchup in integrated...
- Patent number 7,830,165
- Issue date Nov 9, 2010
- Integrated Device Technology, Inc.
- Tan Van Chu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for detecting single event latchup in integrated...
- Publication number 20070229096
- Publication date Oct 4, 2007
- Tan Van Chu
- G01 - MEASURING TESTING