Tang-Hsuan Chung

Person

Kaohsiung City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for testing a semiconductor device
- Patent number 11,150,296
- Issue date Oct 19, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Szu-Chia Huang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing a semiconductor device
- Patent number 10,520,545
- Issue date Dec 31, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Szu-Chia Huang
- G01 - MEASURING TESTING
Information Patent Grant
Static random access memory
- Patent number 10,020,312
- Issue date Jul 10, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd
- Huai-Ying Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing a semiconductor device
- Patent number 9,459,316
- Issue date Oct 4, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Szu-Chia Huang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing a semiconductor device
- Patent number 9,151,798
- Issue date Oct 6, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jhih Jie Shao
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing a semiconductor device
- Patent number 9,075,101
- Issue date Jul 7, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jhih Jie Shao
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing a semiconductor device
- Patent number 8,531,201
- Issue date Sep 10, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jhih-Jie Shao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Testing a Semiconductor Device
- Publication number 20200132757
- Publication date Apr 30, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Szu-Chia Huang
- G01 - MEASURING TESTING
Information Patent Application
STATIC RANDOM ACCESS MEMORY
- Publication number 20170338233
- Publication date Nov 23, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Huai-Ying HUANG
- G11 - INFORMATION STORAGE
Information Patent Application
Method and Apparatus for Testing a Semiconductor Device
- Publication number 20170023644
- Publication date Jan 26, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Szu-Chia Huang
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Testing a Semiconductor Device
- Publication number 20140002127
- Publication date Jan 2, 2014
- Jhih Jie Shao
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE
- Publication number 20130057306
- Publication date Mar 7, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Szu-Chia Huang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE
- Publication number 20130027075
- Publication date Jan 31, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jhih Jie Shao
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE
- Publication number 20130015877
- Publication date Jan 17, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jhih Jie Shao
- G01 - MEASURING TESTING

Tang-Hsuan Chung

Person

Patents Grantslast 30 patents

Method and apparatus for testing a semiconductor device

Method and apparatus for testing a semiconductor device

Static random access memory

Method and apparatus for testing a semiconductor device

Method and apparatus for testing a semiconductor device

Method and apparatus for testing a semiconductor device

Method and apparatus for testing a semiconductor device

Patents Applicationslast 30 patents

Method and Apparatus for Testing a Semiconductor Device

STATIC RANDOM ACCESS MEMORY

Method and Apparatus for Testing a Semiconductor Device

Method and Apparatus for Testing a Semiconductor Device

METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE

METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE

METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE