Tang-Jung Chiu

Person

Hsin-Chu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device structure with magnetic element
- Patent number 12,062,586
- Issue date Aug 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Mill-Jer Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structure with magnetic element
- Patent number 11,631,621
- Issue date Apr 18, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Mill-Jer Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing apparatus and testing method
- Patent number 11,199,578
- Issue date Dec 14, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tang-Jung Chiu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device structure with magnetic element in testing region
- Patent number 11,018,065
- Issue date May 25, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Mill-Jer Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing apparatus and testing method
- Patent number 10,634,717
- Issue date Apr 28, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Tang-Jung Chiu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, test system and method of the same
- Patent number 9,859,176
- Issue date Jan 2, 2018
- Taiwan Semiconductor Manufacturing Company Ltd.
- Tang-Jung Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit package with probe pad structure
- Patent number 9,653,427
- Issue date May 16, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chi-Hsi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming integrated circuit package
- Patent number 9,281,254
- Issue date Mar 8, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chen-Hua Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-gate field-effect transistor with enhanced and adaptable low-...
- Patent number 8,604,549
- Issue date Dec 10, 2013
- National Tsing Hua University
- Tang-Jung Chiu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH MAGNETIC ELEMENT
- Publication number 20230253273
- Publication date Aug 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Mill-Jer WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH MAGNETIC ELEMENT
- Publication number 20210280477
- Publication date Sep 9, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Mill-Jer WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH MAGNETIC ELEMENT IN TESTING REGION
- Publication number 20210057293
- Publication date Feb 25, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mill-Jer WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING APPARATUS AND TESTING METHOD
- Publication number 20200256918
- Publication date Aug 13, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tang-Jung Chiu
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND TESTING METHOD
- Publication number 20190101589
- Publication date Apr 4, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tang-Jung Chiu
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit Package and Methods of Forming Same
- Publication number 20160172333
- Publication date Jun 16, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chi-Hsi Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit Package and Methods of Forming Same
- Publication number 20150228550
- Publication date Aug 13, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chen-Hua Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-GATE FIELD-EFFECT TRANSISTOR WITH ENHANCED AND ADAPTABLE LOW-...
- Publication number 20120168868
- Publication date Jul 5, 2012
- Tang-Jung CHIU
- H01 - BASIC ELECTRIC ELEMENTS

Tang-Jung Chiu

Person

Patents Grantslast 30 patents

Semiconductor device structure with magnetic element

Semiconductor device structure with magnetic element

Testing apparatus and testing method

Semiconductor device structure with magnetic element in testing region

Testing apparatus and testing method

Semiconductor device, test system and method of the same

Integrated circuit package with probe pad structure

Methods of forming integrated circuit package

Multi-gate field-effect transistor with enhanced and adaptable low-...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE STRUCTURE WITH MAGNETIC ELEMENT

SEMICONDUCTOR DEVICE STRUCTURE WITH MAGNETIC ELEMENT

SEMICONDUCTOR DEVICE STRUCTURE WITH MAGNETIC ELEMENT IN TESTING REGION

TESTING APPARATUS AND TESTING METHOD

TESTING APPARATUS AND TESTING METHOD

Integrated Circuit Package and Methods of Forming Same

Integrated Circuit Package and Methods of Forming Same

MULTI-GATE FIELD-EFFECT TRANSISTOR WITH ENHANCED AND ADAPTABLE LOW-...