Tanya Nigam

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Assessment of HCI in logic circuits based on AC stress in discrete...
- Patent number 10,126,354
- Issue date Nov 13, 2018
- GLOBALFOUNDRIES Inc.
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with a laterally diffused metal oxide semiconduc...
- Patent number 8,987,815
- Issue date Mar 24, 2015
- Enpirion, Inc.
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices having bias temperature instability compensation
- Patent number 8,817,570
- Issue date Aug 26, 2014
- GLOBALFOUNDRIES, INC.
- William McMahon
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit with a laterally diffused metal oxide semiconduc...
- Patent number 8,633,540
- Issue date Jan 21, 2014
- Enpirion, Inc.
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit decoupling capacitor arrangement
- Patent number 8,610,188
- Issue date Dec 17, 2013
- GLOBALFOUNDRIES, INC.
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with a laterally diffused metal oxide semiconduc...
- Patent number 8,253,197
- Issue date Aug 28, 2012
- Enpirion, Inc.
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with a laterally diffused metal oxide semiconduc...
- Patent number 8,253,196
- Issue date Aug 28, 2012
- Enpirion, Inc.
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with a laterally diffused metal oxide semiconduc...
- Patent number 8,253,195
- Issue date Aug 28, 2012
- Enpirion, Inc.
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and process for reducing damaging breakdown in...
- Patent number 8,241,986
- Issue date Aug 14, 2012
- Agere Systems Inc.
- Taeho Kook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with a laterally diffused metal oxide semiconduc...
- Patent number 8,212,315
- Issue date Jul 3, 2012
- Enpirion, Inc.
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with a laterally diffused metal oxide semiconduc...
- Patent number 8,212,316
- Issue date Jul 3, 2012
- Enpirion, Inc.
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with a laterally diffused metal oxide semiconduc...
- Patent number 8,212,317
- Issue date Jul 3, 2012
- Enpirion, Inc.
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and process for reducing damaging breakdown in...
- Patent number 8,089,130
- Issue date Jan 3, 2012
- Agere Systems Inc.
- Taeho Kook
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Integrated Circuit with a Laterally Diffused Metal Oxide Semiconduc...
- Publication number 20140131795
- Publication date May 15, 2014
- Enpirion, Inc.
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DECOUPLING CAPACITOR ARRANGEMENT
- Publication number 20140110772
- Publication date Apr 24, 2014
- GLOBALFOUNDRIES, Inc.
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES HAVING BIAS TEMPERATURE INSTABILITY COMPENSATION
- Publication number 20130208555
- Publication date Aug 15, 2013
- GLOBALFOUNDRIES INC.
- William McMahon
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT DECOUPLING CAPACITOR ARRANGEMENT
- Publication number 20130069131
- Publication date Mar 21, 2013
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR RELIABILITY TESTING OF SEMICONDUCTOR DEVICES
- Publication number 20130033285
- Publication date Feb 7, 2013
- GLOBALFOUNDRIES INC.
- William McMahon
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit With A Laterally Diffused Metal Oxide Semiconduc...
- Publication number 20120306011
- Publication date Dec 6, 2012
- Enpirion, Inc.
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND PROCESS FOR REDUCING DAMAGING BREAKDOWN IN...
- Publication number 20120077323
- Publication date Mar 29, 2012
- Agere Systems Incorporated
- Taeho Kook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit with a Laterally Diffused Metal Oxide Semiconduc...
- Publication number 20110049621
- Publication date Mar 3, 2011
- Enpirion Incorporated, A Delaware Corporation
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit with a Laterally Diffused Metal Oxide Semiconduc...
- Publication number 20100052051
- Publication date Mar 4, 2010
- Enpirion, Incorporated, A Delaware Corporation
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit with a Laterally Diffused Metal Oxide Semiconduc...
- Publication number 20100052049
- Publication date Mar 4, 2010
- Enpirion, Incorporated, A Delaware Corporation
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit with a Laterally Diffused Metal Oxide Semiconduc...
- Publication number 20100052050
- Publication date Mar 4, 2010
- Enpirion, Incorporated
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit with a Laterally Diffused Metal Oxide Semiconduc...
- Publication number 20100052052
- Publication date Mar 4, 2010
- Enpirion, Incorporated
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit with a Laterally Diffused Metal Oxide Semiconduc...
- Publication number 20100044789
- Publication date Feb 25, 2010
- Enpirion, Incorporated
- Ashraf W. Lotfi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND PROCESS FOR REDUCING DAMAGING BREAKDOWN IN...
- Publication number 20070290278
- Publication date Dec 20, 2007
- Agere Systems Incorporated
- Taeho Kook
- H01 - BASIC ELECTRIC ELEMENTS

Tanya Nigam

Person

Patents Grantslast 30 patents

Assessment of HCI in logic circuits based on AC stress in discrete...

Integrated circuit with a laterally diffused metal oxide semiconduc...

Devices having bias temperature instability compensation

Integrated circuit with a laterally diffused metal oxide semiconduc...

Integrated circuit decoupling capacitor arrangement

Integrated circuit with a laterally diffused metal oxide semiconduc...

Integrated circuit with a laterally diffused metal oxide semiconduc...

Integrated circuit with a laterally diffused metal oxide semiconduc...

Semiconductor device and process for reducing damaging breakdown in...

Integrated circuit with a laterally diffused metal oxide semiconduc...

Integrated circuit with a laterally diffused metal oxide semiconduc...

Integrated circuit with a laterally diffused metal oxide semiconduc...

Semiconductor device and process for reducing damaging breakdown in...

Patents Applicationslast 30 patents

Integrated Circuit with a Laterally Diffused Metal Oxide Semiconduc...

INTEGRATED CIRCUIT DECOUPLING CAPACITOR ARRANGEMENT

DEVICES HAVING BIAS TEMPERATURE INSTABILITY COMPENSATION

INTEGRATED CIRCUIT DECOUPLING CAPACITOR ARRANGEMENT

METHODS FOR RELIABILITY TESTING OF SEMICONDUCTOR DEVICES

Integrated Circuit With A Laterally Diffused Metal Oxide Semiconduc...

SEMICONDUCTOR DEVICE AND PROCESS FOR REDUCING DAMAGING BREAKDOWN IN...

Integrated Circuit with a Laterally Diffused Metal Oxide Semiconduc...

Integrated Circuit with a Laterally Diffused Metal Oxide Semiconduc...

Integrated Circuit with a Laterally Diffused Metal Oxide Semiconduc...

Integrated Circuit with a Laterally Diffused Metal Oxide Semiconduc...

Integrated Circuit with a Laterally Diffused Metal Oxide Semiconduc...

Integrated Circuit with a Laterally Diffused Metal Oxide Semiconduc...

SEMICONDUCTOR DEVICE AND PROCESS FOR REDUCING DAMAGING BREAKDOWN IN...