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Tao Li
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Calgary, CA
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for point of sale ordering
Patent number
11,162,791
Issue date
Nov 2, 2021
Invensense, Inc.
Da Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for assigning point of sale information
Patent number
10,547,976
Issue date
Jan 28, 2020
Invensense, Inc.
Abdelrahman Ali
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for estimating uncertainty for offline map inform...
Patent number
10,126,134
Issue date
Nov 13, 2018
Invensense, Inc.
Mostafa Elhoushi
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for using offline map information aided enhanced...
Patent number
10,018,474
Issue date
Jul 10, 2018
Invensense, Inc.
Tao Li
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for using map information aided enhanced porta...
Patent number
9,797,732
Issue date
Oct 24, 2017
Invensense, Inc.
Tao Li
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND SYSTEM FOR ASSIGNING POINT OF SALE INFORMATION
Publication number
20180070213
Publication date
Mar 8, 2018
InvenSense, Inc.
Abdelrahman Ali
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR ESTIMATING UNCERTAINTY FOR OFFLINE MAP INFORM...
Publication number
20170219359
Publication date
Aug 3, 2017
InvenSense, Inc.
Mostafa Elhoushi
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR USING OFFLINE MAP INFORMATION AIDED ENHANCED...
Publication number
20170176191
Publication date
Jun 22, 2017
InvenSense, Incorporated
Tao Li
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR POINT OF SALE ORDERING
Publication number
20170178102
Publication date
Jun 22, 2017
InvenSense, Inc.
Da Wang
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR USING MAP INFORMATION AIDED ENHANCED PORTA...
Publication number
20160069690
Publication date
Mar 10, 2016
InvenSense, Inc.
Tao Li
G01 - MEASURING TESTING