Membership
Tour
Register
Log in
Tao Xue
Follow
Person
Beijing, CN
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Massive picture processing method converting decimal element in mat...
Patent number
11,395,010
Issue date
Jul 19, 2022
Beijing JingDong ShangKe Information Technology Co., Ltd.
Limin Yang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detector in a scattered configuration applied to X/gamma ray contai...
Patent number
9,915,751
Issue date
Mar 13, 2018
Nuctech Company Limited
Kejun Kang
G01 - MEASURING TESTING
Information
Patent Grant
Vehicle mounted mobile container or vehicle inspection system
Patent number
9,823,382
Issue date
Nov 21, 2017
Nuctech Company Limited
Jianmin Li
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Semiconductor detector
Patent number
9,766,354
Issue date
Sep 19, 2017
Nuctech Company Limited
Yuanjing Li
G01 - MEASURING TESTING
Information
Patent Grant
Gantry configuration for combined mobile radiation inspection system
Patent number
9,453,935
Issue date
Sep 27, 2016
Nuctech Company Limited
Jianmin Li
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Patents Applications
last 30 patents
Information
Patent Application
MASSIVE PICTURE PROCESSING METHOD, DEVICE, ELECTRONIC APPARATUS AND...
Publication number
20200204832
Publication date
Jun 25, 2020
BEIJING JINGDONG SHANGKE INFORMATION TECHNOLOGY CO LTD.
Limin YANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETECTOR IN A SCATTERED CONFIGURATION APPLIED TO X/GAMMA RAY CONTAI...
Publication number
20160231453
Publication date
Aug 11, 2016
Nuctech Company Limited
Kejun KANG
G01 - MEASURING TESTING
Information
Patent Application
VEHICLE MOUNTED MOBILE CONTAINER OR VEHICLE INSPECTION SYSTEM
Publication number
20160170073
Publication date
Jun 16, 2016
Nuctech Company Limited
Jianmin LI
B60 - VEHICLES IN GENERAL
Information
Patent Application
GANTRY CONFIGURATION FOR COMBINED MOBILE RADIATION ISPECTION SYSTEM
Publication number
20150192689
Publication date
Jul 9, 2015
Nuctech Company Limited
Jianmin Li
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DETECTOR
Publication number
20140319635
Publication date
Oct 30, 2014
TSINGHUA UNIVERSITY
Yuanjing Li
G01 - MEASURING TESTING