TREA

Tao Yuan

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  • Troy, NY, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Field induced THz wave emission microscope
    • Patent number 7,230,245
    • Issue date Jun 12, 2007
    • Rensselaer Polytechnic Institute
    • Xi-Cheng Zhang
    • G01 - MEASURING TESTING
  • Information Patent Grant

    T-ray Microscope
    • Patent number 6,977,379
    • Issue date Dec 20, 2005
    • Rensselaer Polytechnic Institute
    • Xi-Cheng Zhang
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Field induced THz wave emission microscope
    • Publication number 20060022141
    • Publication date Feb 2, 2006
    • Xi-Cheng Zhang
    • G01 - MEASURING TESTING
  • Information Patent Application

    T-RAY MICROSCOPE
    • Publication number 20050230625
    • Publication date Oct 20, 2005
    • Xi-Cheng Zhang
    • G02 - OPTICS