Tapan J. Chakraborty

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Mercerville, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Delay testing of high-performance digital components by a slow-spee...
- Patent number 5,606,567
- Issue date Feb 25, 1997
- Lucent Technologies Inc.
- Vishwani D. Agrawal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for test generation and fault simulation for s...
- Patent number 5,499,249
- Issue date Mar 12, 1996
- AT&T Corp.
- Vishwani D. Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing delay faults in non-scan sequential circuits
- Patent number 5,365,528
- Issue date Nov 15, 1994
- AT&T Bell Laboratories
- Vishwani D. Agrawal
- G01 - MEASURING TESTING