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Tapan Jyoti Chakraborty
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West Windsor, NJ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for describing components adapted for dynamica...
Patent number
7,962,885
Issue date
Jun 14, 2011
Alcatel-Lucent USA Inc.
Tapan J. Chakraborty
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for describing and testing a system-on-chip
Patent number
7,958,479
Issue date
Jun 7, 2011
Alcatel-Lucent USA Inc.
Tapan J. Chakraborty
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for isolating portions of a scan path of a sys...
Patent number
7,958,417
Issue date
Jun 7, 2011
Alcatel-Lucent USA Inc.
Tapan Chakraborty
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for controlling dynamic modification of a scan...
Patent number
7,954,022
Issue date
May 31, 2011
Alcatel-Lucent USA Inc.
Tapan Chakraborty
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for describing parallel access to a system-on-...
Patent number
7,949,915
Issue date
May 24, 2011
Alcatel-Lucent USA Inc.
Tapan J. Chakraborty
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for injecting transient hardware faults for so...
Patent number
7,689,866
Issue date
Mar 30, 2010
Alcatel-Lucent USA Inc.
Tapan Jyoti Chakraborty
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Fault-tolerant architecture of flip-flops for transient pulses and...
Patent number
7,594,150
Issue date
Sep 22, 2009
Alcatel-Lucent USA Inc.
Tapan Jyoti Chakraborty
G01 - MEASURING TESTING
Information
Patent Grant
Soft error tolerant flip flops
Patent number
7,482,831
Issue date
Jan 27, 2009
Alcatel-Lucent USA Inc.
Tapan Jyoti Chakraborty
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Fault injection method and system
Patent number
7,284,159
Issue date
Oct 16, 2007
Lucent Technologies Inc.
Tapan J. Chakraborty
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for testing cluster circuits in a boundary scan e...
Patent number
6,378,094
Issue date
Apr 23, 2002
Lucent Technologies Inc.
Tapan Jyoti Chakraborty
G01 - MEASURING TESTING
Information
Patent Grant
Arrangement for fault detection in circuit interconnections
Patent number
6,167,542
Issue date
Dec 26, 2000
Lucent Technologies
Tapan Jyoti Chakraborty
G01 - MEASURING TESTING
Information
Patent Grant
Bist architecture for detecting path-delay faults in a sequential c...
Patent number
6,148,425
Issue date
Nov 14, 2000
Lucent Technologies Inc.
Sudipta Bhawmik
G01 - MEASURING TESTING
Information
Patent Grant
Testing of live circuit boards
Patent number
6,124,715
Issue date
Sep 26, 2000
Lucent Technologies, Inc.
Tapan Jyoti Chakraborty
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS AND METHOD FOR CONTROLLING DYNAMIC MODIFICATION OF A SCAN...
Publication number
20090193306
Publication date
Jul 30, 2009
Tapan Chakraborty
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for Isolating Portions of a Scan Path of a Sys...
Publication number
20090193304
Publication date
Jul 30, 2009
Tapan Chakraborty
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for describing parallel access to a system-on-...
Publication number
20090144593
Publication date
Jun 4, 2009
Tapan J. Chakraborty
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and Apparatus for Describing Components Adapted for Dynamica...
Publication number
20090144592
Publication date
Jun 4, 2009
Tapan J. Chakraborty
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR DESCRIBING AND TESTING A SYSTEM-ON-CHIP
Publication number
20090144594
Publication date
Jun 4, 2009
Tapan J. Chakraborty
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR INJECTING TRANSIENT HARDWARE FAULTS FOR SO...
Publication number
20080155328
Publication date
Jun 26, 2008
Tapan Jyoti Chakraborty
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Soft error tolerant flip flops
Publication number
20070262787
Publication date
Nov 15, 2007
LUCENT TECHNOLOGIES INC.
Tapan Jyoti Chakraborty
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Fault-tolerant architecture of flip-flops for transient pulses and...
Publication number
20070266282
Publication date
Nov 15, 2007
LUCENT TECHNOLOGIES INC.
Tapan Jyoti Chakraborty
G01 - MEASURING TESTING
Information
Patent Application
Fault injection method and system
Publication number
20050050393
Publication date
Mar 3, 2005
Tapan J. Chakraborty
G01 - MEASURING TESTING