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Taro Asai
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Hamura, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and manufacturing method thereof
Patent number
7,670,858
Issue date
Mar 2, 2010
Hitachi, Ltd.
Hiroyuki Enomoto
G01 - MEASURING TESTING
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Patent Grant
Semiconductor device and manufacturing method thereof
Patent number
7,411,260
Issue date
Aug 12, 2008
Hitachi, Ltd.
Hiroyuki Enomoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
Publication number
20080274576
Publication date
Nov 6, 2008
Hitachi, Ltd.
Hiroyuki Enomoto
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
Publication number
20080079099
Publication date
Apr 3, 2008
Hiroyuki Enomoto
G01 - MEASURING TESTING