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Taro Ogawa
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Micro-spectroscopic measuring device and micro-chemical system
Patent number
7,145,146
Issue date
Dec 5, 2006
Hitachi, Ltd.
Taro Ogawa
G01 - MEASURING TESTING
Information
Patent Grant
Reflection photomasks including buffer layer comprising group VIII...
Patent number
6,699,625
Issue date
Mar 2, 2004
Samsung Electronics Co., Ltd.
Byoung-taek Lee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical element and projection exposure apparatus employing the same
Patent number
5,485,497
Issue date
Jan 16, 1996
Hitachi, Ltd.
Hiroaki Oizumi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
X-ray exposure method with an X-ray mask comprising phase shifter s...
Patent number
5,372,916
Issue date
Dec 13, 1994
Hitachi, Ltd.
Taro Ogawa
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Pattern fabrication by radiation-induced graft copolymerization
Patent number
4,954,424
Issue date
Sep 4, 1990
Hitachi, Ltd.
Kozo Mochiji
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Crystal monochromator
Patent number
4,737,973
Issue date
Apr 12, 1988
Hitachi, Ltd.
Taro Ogawa
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
Micro-spectroscopic measuring device and micro-chemical system
Publication number
20050017178
Publication date
Jan 27, 2005
Taro Ogawa
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Microreactor, its production method, and sample screening device
Publication number
20040228774
Publication date
Nov 18, 2004
Hitachi, Ltd.
Taro Ogawa
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Reflection photomasks including buffer layer comprising group VIII...
Publication number
20020045108
Publication date
Apr 18, 2002
Byoung-taek Lee
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY