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Tassanee Payakapan
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San Jose, CA, US
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last 30 patents
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Patent Grant
Testing of a programmable device
Patent number
7,454,675
Issue date
Nov 18, 2008
Xilinx, Inc.
Robert W. Wells
G01 - MEASURING TESTING
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Patent Grant
Built-in self test (BIST) technology for testing field programmable...
Patent number
7,302,625
Issue date
Nov 27, 2007
Xilinx, Inc.
Tassanee Payakapan
G06 - COMPUTING CALCULATING COUNTING