Tassanee Payakapan

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Toronto, CA

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Patents Grantslast 30 patents

Information Patent Grant
Circuit for and method of testing for faults in a programmable logi...
- Patent number 7,761,755
- Issue date Jul 20, 2010
- Xilinx, Inc.
- Tassanee Payakapan
- G01 - MEASURING TESTING
Information Patent Grant
Testing of a programmable device
- Patent number 7,725,787
- Issue date May 25, 2010
- Xilinx, Inc.
- Robert W. Wells
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SELECTIVE SCAN INSERTION FOR RAPID SCAN DESIGN VERIFICATION
- Publication number 20240037312
- Publication date Feb 1, 2024
- David Akselrod
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-CHIP DISTRIBUTION OF TEST DATA FOR MULTIPLE DIES
- Publication number 20230204662
- Publication date Jun 29, 2023
- Advanced Micro Devices Products (China) Co. Ltd.,
- Arie MARGULIS
- G01 - MEASURING TESTING