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Tasuku Fujibe

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  • Tokyo, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC TEST EQUIPMENT
    • Publication number 20240027520
    • Publication date Jan 25, 2024
    • Advantest Corporation
    • Hiroki ICHIKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC TEST EQUIPMENT
    • Publication number 20240027522
    • Publication date Jan 25, 2024
    • Advantest Corporation
    • Takayuki TANAKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC TEST EQUIPMENT
    • Publication number 20240027521
    • Publication date Jan 25, 2024
    • Advantest Corporation
    • Hiroki ICHIKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC TEST EQUIPMENT
    • Publication number 20240027523
    • Publication date Jan 25, 2024
    • Advantest Corporation
    • Hiroki ICHIKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    CLOCK HAND-OFF CIRCUIT
    • Publication number 20110128052
    • Publication date Jun 2, 2011
    • Advantest Corporation
    • Tasuku Fujibe
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    SEMICONDUCTOR INTEGRATED CIRCUIT
    • Publication number 20110109377
    • Publication date May 12, 2011
    • Advantest Corporation
    • Tasuku Fujibe
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    TESTING DEVICE, TESTING METHOD, COMPUTER PROGRAM PRODUCT, AND RECOR...
    • Publication number 20090077435
    • Publication date Mar 19, 2009
    • Advantest Corporation
    • TASUKU FUJIBE
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    DETECTION APPARATUS AND TEST APPARATUS
    • Publication number 20090006025
    • Publication date Jan 1, 2009
    • Advantest Corporation
    • TASUKU FUJIBE
    • G01 - MEASURING TESTING